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Complementing Secondary Ion Mass Spectrometry with other Ion-, Electron-and Photon-based Analytical Microscopies
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 342-343
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- July 2016
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Latest developments on NanoSIMS instrumentation for life science and materials
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 930-931
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- July 2012
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3D Atom Probe for Nano-scale Chemical Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 60-61
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- July 2010
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3D Atom Probe and SIMS as complementary techniques for the observation and quantitative measurement of microstructures
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1232-1233
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- August 2008
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