10 results
Aberration-Corrected Electron Microscopy Studies of Novel Nanostructures in Highly Aligned Nano-twinned Metals
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1566-1567
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- July 2010
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Aberration-corrected HAADF-STEM Studies of Nano-gold/titania Catalysts
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1200-1201
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- July 2010
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The 1Å Double Aberration Corrected ETEM and ESTEM Project at York
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 548-549
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- August 2007
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Nanoparticle, Thin Film and Surface Sensitive Analysis in the SEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 584-585
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- August 2007
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Realizing the Potential for Real Surface and Nanoparticle Analysis with an SEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1448-1449
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- August 2006
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Nanotechnology in the Laboratory and in Society
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 556-557
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- August 2006
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Pros and Cons of Low Voltage SEM EDX Elemental Analysis
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- Journal:
- Microscopy Today / Volume 11 / Issue 1 / February 2003
- Published online by Cambridge University Press:
- 14 March 2018, pp. 5-11
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- February 2003
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Archie Howie Symposium : Celebrations in Pioneering Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 658-659
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- August 1999
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Controlled Environment (ECELL) HREM
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 589-590
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- August 1997
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Surface Sensitivity and Resolution in LVSEM Imaging and Microanalysis
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1219-1220
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- August 1997
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