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Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 214-215
- Print publication:
- July 2017
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Overcoming Traditional Challenges in Nano-scale X-ray Characterization Using Independent Component Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1227-1228
- Print publication:
- August 2015
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