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Assessment of the Tomographic Atom Probe Technique for Nanoscale Characterization : Comparison with SIMS Technique
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1636-1637
- Print publication:
- August 2007
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Atomic-scale investigation of microstructures by 3D atom-probe microscopy
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- Journal:
- Revue de Métallurgie – International Journal of Metallurgy / Volume 99 / Issue 12 / December 2002
- Published online by Cambridge University Press:
- 22 January 2003, pp. 1111-1117
- Print publication:
- December 2002
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