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Analysis of Bulk Dielectrics with Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1254-1255
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- August 2008
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Arsenic Segregation to Dislocation Loops in Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 324-325
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- August 2008
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Three Dimensional Laser-assisted Atom-probe Tomography: Advanced Analysis of Si Nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1738-1739
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- August 2006
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Structured triangular limit algebras
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- Journal:
- Proceedings of the London Mathematical Society / Volume 75 / Issue 1 / July 1997
- Published online by Cambridge University Press:
- 01 July 1997, pp. 177-193
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- July 1997
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