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Quantitative SEM/EDS, Step 1: What Constitutes a Sufficiently Flat Specimen?
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1244-1245
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- August 2013
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Designing the Optimal Quantitative Electron Probe X-ray Microanalysis Measurement
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1248-1249
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- August 2013
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Use of an Automated SEM to Detect Laboratory Contamination
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1066-1067
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- August 2013
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Breaking the 1% Accuracy Barrier in EPMA
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1006-1007
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- July 2012
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How To Do Really Bad SEM/EDS Quantitative Analysis, and Never Even Notice!
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1004-1005
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- July 2012
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Trace Analysis Is Worthless If the Peaks Are Misidentified!
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1010-1011
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- July 2012
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A Seasonal Record of Total Particulate Matter Embedded in Greenland Surface Snow
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 478-479
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- August 2001
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