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High-resolution electron microscopy investigations of stacking faults in Y1Ba2Cu3O7−δ metalorganic chemical vapor deposited thin films
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- Journal:
- Journal of Materials Research / Volume 14 / Issue 7 / July 1999
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2732-2738
- Print publication:
- July 1999
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- Article
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