2 results
High-Resolution Metrology in the TEM
-
- Journal:
- Microscopy Today / Volume 20 / Issue 3 / May 2012
- Published online by Cambridge University Press:
- 03 May 2012, pp. 46-49
- Print publication:
- May 2012
-
- Article
-
- You have access
- HTML
- Export citation
High Resolution EFTEM and PEELS of Ga/GaAs Nano–“Ice Cream Cones” Grown by Dual-Wavelength Pulsed Laser Deposition
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1914-1915
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation