4 results
Twist and Bend in Van Der Waals Materials and 2D Stacked Heterostructures
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 856-858
- Print publication:
- August 2020
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Two Methods for Measuring Lamellae Thicknesses In situ for Improved FIB Specimen Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 858-859
- Print publication:
- August 2019
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Understanding 2D Crystal Vertical Heterostructures at the Atomic Scale Using Advanced Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1714-1715
- Print publication:
- July 2017
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Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 107-108
- Print publication:
- August 2015
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