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Instrumented nanoindentation and scanning electron transmission microscopy applied to the study of the adhesion of InP membranes heteroepitaxially bonded to Si
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- Journal:
- The European Physical Journal - Applied Physics / Volume 65 / Issue 2 / February 2014
- Published online by Cambridge University Press:
- 14 February 2014, 20702
- Print publication:
- February 2014
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- Article
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