Through recent years, off-axis electron holography has helped us to understand and to overcome some experimental restrictions in transmission electron microscopy. With development of powerful electron microscopes, slow-scan CCD cameras, and computers, holography is not an academic technique anymore used by specialized laboratories. Holography has proven its wide range of applications in solving real-world problems in materials science and biology. At medium resolution, that is, on nanometer scale, holography allows access to large area phase contrast produced by magnetic fields and electric potentials. In the high-resolution domain, holography unveils its power by unscrambling amplitude and phase of the electron wave, resulting in an improved lateral resolution up to the information limit. Holography is a thoroughly quantitative method, and, in combination with the perfect zero-loss filtering inherent to this method, the interpretation of the reconstructed data is strongly simplified. After outlining the basics of holography, in this tutorial we focus on development of a step-by-step procedure for recording and reconstruction of holograms. At the end, some recent applications are discussed.

Through recent years, off-axis electron holography has helped us to understand and to overcome some experimental restrictions in transmission electron microscopy. With development of powerful electron microscopes, slow-scan CCD cameras, and computers, holography is not an academic technique anymore used by specialized laboratories. Holography has proven its wide range of applications in solving real-world problems in materials science and biology. At medium resolution, that is, on nanometer scale, holography allows access to large area phase contrast produced by magnetic fields and electric potentials. In the high-resolution domain, holography unveils its power by unscrambling amplitude and phase of the electron wave, resulting in an improved lateral resolution up to the information limit. Holography is a thoroughly quantitative method, and, in combination with the perfect zero-loss filtering inherent to this method, the interpretation of the reconstructed data is strongly simplified. After outlining the basics of holography, in this tutorial we focus on development of a step-by-step procedure for recording and reconstruction of holograms. At the end, some recent applications are discussed.

We have recently reported the synthesis of one-dimensional nanobelt structures of ZnO, SnO2, In2O3, CdO, Ga2O3, and PbO2 by evaporating the desired commercial metal oxide powders at high temperatures (Science (2001), 291, 1947). The as-synthesized oxide nanobelts are pure, structurally uniform, single crystalline, and most of them free from dislocations. The beltlike morphology appears to be a unique and common structural characteristic for the family of semiconducting oxides. In the present article, we focus on the twin and stacking fault planar defects found in oxide nanobelts and nanowires although they are rarely observed. Some interesting and unique growth morphologies are presented to illustrate the roles played by surface energy and kinetics in growth. It is shown that the surfaces of the oxide nanobelts are enclosed by the low-index, low-energy crystallographic facets. The growth morphology is largely dominated by the growth kinetics.

This article presents a comprehensive investigation of (La, Sr)FeO3 by correlated atomic resolution annular dark field imaging and electron energy loss spectroscopy. Here, the ability of these techniques to characterize point defect formation and phase transitions under reducing conditions in situ in the scanning transmission electron microscope is evaluated and the influence of oxygen vacancies on the structure–property relationships is discussed. In particular, the evolution of the Ruddlesden–Popper, Brownmillerite, and Aurivillius phases can be associated directly with the ionic and electronic conductivity of the bulk material under different thermodynamic conditions. These results lead naturally to an atomistic defect chemistry model to explain the high temperature ionic and electronic conductivity in this and other perovskite materials.

A melt-spun Mg-1.5%wtCa-6wt%Zn alloy was analyzed by means of transmission electron microscopy, energy dispersive X-ray spectroscopy, and scanning transmission electron microscopy. The as-solidified alloy exhibited both spherical matrix precipitates and elongated precipitates at the grain boundaries (grain-boundary films). After heat treatment, the alloy showed faceted precipitates (cuboidal shape), mostly on dislocations. It was found that the observed precipitates are the same compound, Ca2Mg6Zn3. As there was no crystallographic data for this compound in the literature, its crystal structure was investigated by comparison of experimental and simulated selected-area electron-diffraction patterns and high-resolution electron microscopy images. This study indicated that Ca2Mg6Zn3 is a trigonal compound with space group P31c and lattice parameters a = 0.97 nm, c = 1.0 nm.

Experimental difficulties in studying nanostructures stem from their small size, which limits the use of traditional techniques for measuring their physical properties. We have developed a nanostructure manipulation device to apply tension to chain aggregates mounted in a transmission electron microscope. A 1-mm-long slit was cut in the center of a lead–tin alloy disc, measuring 3 mm in diameter and 200 μm in thickness. The disc was heated to about 140°C before it was pressed between two quartz slides. The disc was then thinned by mechanical dimpling and ion milling until holes developed around the slit. The edges of the slit were 0.2 to 3 μm in thickness while the gap between them was up to a few microns. This disc was bonded to the two plates of a cartridge. The slit could be widened or narrowed at controlled speeds of 0.5 to 300 nm/s. The system was tested using titania (TiO2) nanoparticle chain aggregates (NCA) deposited across the slit. The ends of the NCA remained attached to the edges of the slit, which was widened at about 0.7 nm/s. In this way, the NCA was stretched up to 176% of its initial length before breaking.

The focused ion beam lift-out technique for scanning electron microscope (SEM) and transmission electron microscope (TEM) sample preparation was shown to be applicable to copper/low-k dielectric semiconductor technology. High resolution SEM, TEM, and scanning transmission electron microscope analyses were performed on metal contacts and resist vias with no evidence of the interface damage or metal smearing commonly observed with mechanical polishing. Ion milling of the sample ex situ to the substrate provided decoration and adjustment of the exposed plane of the section when necessary for SEM analysis.

In this work, effective, yet simple, recycling mechanisms for used scanning probe microscopy (SPM) tips were implemented. Comprising a tip profile characterization methodology and specific cleaning procedures, which decontaminate SPM tips whether the contamination nature is known or not, such routes were optimized during numerous tests with brand new, previously used, and already discarded categories of SPM tips. The results show that if the used tip suffered contamination only, but no physical damages, during its scanning lifetime, it becomes readily available for reutilization after the cleansing process, characterizing a recycling route. On the other hand, if the tip went through wear and breakages during its utilization, it still can be decontaminated, but may not be directly reutilized due to its inadequate physical profile. Nevertheless, the methodology developed in this work may yet be applied as part of a more complex recycling route.

This book is a compilation of papers presented at the EMAG (Electron Microscopy and Analysis Group of the Institute of Physics) conference held September 5–7, 2001 at the University of Dundee in Scotland. The papers are four pages long, on average, and grouped by subject matter. This book may make a good reference for anyone well-versed in electron microscopy. The paper topics are focused and detailed about a specific material or technique, with some exceptions, and may not be useful as a general reference to the novice. For example, complicated mathematical derivations, high resolution TEM images, and simulated structures are presented in a number of papers without detailed explanation to the less-initiated reader.