Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-26T06:07:45.780Z Has data issue: false hasContentIssue false

Nanostructure Manipulation Device for Transmission Electron Microscopy: Application to Titania Nanoparticle Chain Aggregates

Published online by Cambridge University Press:  06 December 2002

Yong J. Suh
Affiliation:
Department of Chemical Engineering, University of California, Los Angeles, CA 90095, USA
Sergey V. Prikhodko
Affiliation:
Department of Materials Science and Engineering, University of California, Los Angeles, CA 90095, USA
Sheldon K. Friedlander
Affiliation:
Department of Chemical Engineering, University of California, Los Angeles, CA 90095, USA
Get access

Abstract

Experimental difficulties in studying nanostructures stem from their small size, which limits the use of traditional techniques for measuring their physical properties. We have developed a nanostructure manipulation device to apply tension to chain aggregates mounted in a transmission electron microscope. A 1-mm-long slit was cut in the center of a lead–tin alloy disc, measuring 3 mm in diameter and 200 μm in thickness. The disc was heated to about 140°C before it was pressed between two quartz slides. The disc was then thinned by mechanical dimpling and ion milling until holes developed around the slit. The edges of the slit were 0.2 to 3 μm in thickness while the gap between them was up to a few microns. This disc was bonded to the two plates of a cartridge. The slit could be widened or narrowed at controlled speeds of 0.5 to 300 nm/s. The system was tested using titania (TiO2) nanoparticle chain aggregates (NCA) deposited across the slit. The ends of the NCA remained attached to the edges of the slit, which was widened at about 0.7 nm/s. In this way, the NCA was stretched up to 176% of its initial length before breaking.

Type
Research Article
Copyright
© 2002 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)