Research Article
Channelplate Illumination Correction for Secondary Ion Mass Spectroscopy Images by Solving Apparatus Elasticity Equations
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- 29 January 2003, pp. 407-412
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Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate
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- 29 January 2003, pp. 413-419
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Origin of Threefold Periodicity in High-Resolution Transmission Electron Microscopy Images of Thin Film Cubic SiC
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- 29 January 2003, pp. 420-427
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Direct Evidence for Grain Boundary Potential Barrier Breakdown via In Situ Electron Holography
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- 29 January 2003, pp. 428-436
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Empirical Identification of Uranium Oxides and Fluorides Using Electron Energy-loss Spectroscopy in the Transmission Electron Microscope
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- 29 January 2003, pp. 437-444
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Transmission Electron Microscopy Characterization and Application of Sol-Gel Membranes
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- 29 January 2003, pp. 445-451
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Other
Transmission Electron Microscopy-A Textbook for Materials Science, by David B. Williams and C. Barry Carter
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- 29 January 2003, pp. 452-453
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Author Index to Volume 5
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- 29 January 2003, pp. 456-457
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Subject Index to Volume 5
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- 29 January 2003, pp. 458-460
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