DENVER X-RAY CONFERENCE
D-47 Cultural Heritage Studies with High-Energy X-rays at the APS 1-ID Beamline
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- 20 May 2016, p. 176
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F-6 The Yin and Yan of XRF Analysis as a Tool in the Investigation of Cultural Heritage Works
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- 20 May 2016, p. 176
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F-61 SANDRA: A Portable XRF System for Non Destructive Studies of Mexican Cultural Heritage
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- 20 May 2016, p. 176
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C-13 Invited—Time Resolved X-ray Full-Field Micro-Imaging of Transient Fluid Dynamics
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- 20 May 2016, p. 177
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F-12 Invited—A High Resolution Hard X-ray Bioimaging Facility At SSRL
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- 20 May 2016, p. 177
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C-19 3-D Tomographic Studies of Annealed Nanoporous Gold Using Transmission X-ray Microscope (TXM) at Advanced Photon Source
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- 20 May 2016, p. 177
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D-58 Nanostructure Analysis of Metallic Materials by Coherent X-ray Diffraction Microscopy
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- 20 May 2016, p. 177
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C-9 Invited—Realtime XRF and XRD Imaging—The Instrumentation and the Applications
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- 20 May 2016, p. 177
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F-39 A Top-Down Approach Using X-ray Imaging Techniques: Instrumental Developments and Applications in Life Science
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- 20 May 2016, p. 177
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F-38 Applications of Confocal Micro X-ray Fluorescence 3-Dimensional Elemental Imaging
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- 20 May 2016, p. 177
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Title to be announced
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- 20 May 2016, p. 177
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D-35 Invited—In-Situ Characterisation of Novel Fuel Cell Materials
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- 20 May 2016, p. 177
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D-11 In-Situ XRD Analysis of the Growth of ZnO Nanowires
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- 20 May 2016, p. 177
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D-17 Kinetics of Particle Growth for Supported Pt and Pt/Pd Determined Using HTXRD
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- 20 May 2016, p. 177
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D-54 In Situ Heating Studies on the Internal Stresses of Multilayer Environmental Barrier Coatings
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- 20 May 2016, p. 178
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D-48 Novel Processing of Nickel Containing Cordierite Glass-Ceramics for Microporous Gas Separation Membranes
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- 20 May 2016, p. 178
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D-44 Study of Combustion Syntheses by Time-Resolved X-ray Diffraction: Comparison of Synthesis Mechanisms for Different Combustion Modes
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- 20 May 2016, p. 178
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D-55 Nanoscale Photocatalysts Derived from Layered Phases: Formation and Characterization
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- 20 May 2016, p. 178
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F-67 Invited—High-Definition X-ray Fluorescence: Principles and Applications
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- 20 May 2016, p. 178
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F-5 MCLLS Approach to EDXRF Analysis on XOS Devices
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- 20 May 2016, p. 178
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