Powder Diffraction: Volume 20 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 20 - Issue 2 - June 2005

Contents

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Denver X-Ray Conference

Denver X-ray Conference
Published online by Cambridge University Press:

01 March 2012, pp. 165-170
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C19 Biomedical X-ray Imaging, Current Status and Some Future Challenges
E.L. Ritman
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20 May 2016, p. 171
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C24 Where are we after the Decade-Long Renaissance in X-ray Imaging?
A. Snigirev
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20 May 2016, p. 171
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C16 X-ray Backscatter Imaging: Photography Through Barriers
J. Callerame
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20 May 2016, p. 171
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C18 Geoscience Applications of Synchrotron X-ray Imaging
M.L. Rivers
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20 May 2016, p. 171
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F06 A New Generation of Bragg Polarization Optics in EDXRF
J. Heckel
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20 May 2016, p. 172
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F68 Development Trends in the Design of WDXRF Spectrometers and their Implementation in the New 9900 Thermoarl SIM/SEQ Instrument
A. Buman
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20 May 2016, p. 172
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F32 Weighing Machine and Flux Dispenser, Theant…Take the Weight Off Your Mind!
F. Bouker
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20 May 2016, p. 172
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F46 Advancements in Portable XRF Instrumentation
B. Hubbard-Nelson, R. Koch, K. Russell, R. Russell, D. Sackett
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20 May 2016, p. 172
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F53 An XRF Measuring Platform Utilizing a Miniature X-ray Tube and a Silicon PIN Diode Detector
C. Jensen, A. Reyes-Mena, E. Bard, S. Liddiard, S. Ogden, K. Decker, C. Carter, M. Moras
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20 May 2016, p. 172
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F33 Multi-Spectral XRF Counting: Squeeze Twice as much Information from Your Detector
W.K. Warburton, P. Grudberg, J. Harris, B. Cross
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20 May 2016, p. 172
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D104 Definitive Mineralogical Analysis on Mars Using X-ray Diffraction
P. Sarrazin, D. Blake, D. Bish, D. Vaniman, S. Chipera, M. Gailhanou
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20 May 2016, p. 172
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D098 The Focusing Mirror: New Possibilities for Transmission Powder XRD
M. Fransen, D. Beckers, V. Kogan, S. Prugovecki
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20 May 2016, p. 172
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D010 DHS1100—A New High Temperature Stage for Multipurpose 4-Circle X-ray Goniometers
R. Resel, M. Koini, T. Haber, J. Keckes, P. Hofbauer
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20 May 2016, p. 172
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C14 An X-ray Nanodiffraction Technique for Individual Crystalline Nanoobjects
Y. Xiao, Z. Cai, B. Lai, Y.S. Chu
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20 May 2016, p. 172
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D012 Phase Imaging with an X-ray Talbot Interferometer—Invited
A. Momose, I. Koyama, W. Yashiro, Y. Suzuki, T. Hattori
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20 May 2016, p. 173
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C22 Quantitative Sub-100nm Phase-Contrast Imaging Using an SEM-Based Full-Field X-ray Microscope—Invited
S.W. Wilkins, D. Gao, T.E. Gureyev, S.C. Mayo, P.R. Miller, Y. Nesterets, D. Parry, A. Pogany, A.W. Stevenson, D. Paganin
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20 May 2016, p. 173
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D045 Scientific Applications of Phase-Contrast Diffraction Imaging
Y.S. Chu, A. Tkachuk
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20 May 2016, p. 173
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D019 Factors Affecting In-Line Phase Contrast Imaging with a Laboratory Microfocus X-ray Source
K.L. Kelly, B.K. Tanner
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20 May 2016, p. 173
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C01 Time-Resolved X-ray Imaging in Studies of Advanced Alloy Solidification Processes—Invited
R.H. Mathiesen, L. Arnberg
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20 May 2016, p. 173
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Page 2 of 8

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Powder Diffraction

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Volume 20 - Issue 2 - June 2005

Denver X-Ray Conference

Denver X-ray Conference

C19 Biomedical X-ray Imaging, Current Status and Some Future Challenges

C24 Where are we after the Decade-Long Renaissance in X-ray Imaging?

C16 X-ray Backscatter Imaging: Photography Through Barriers

C18 Geoscience Applications of Synchrotron X-ray Imaging

F06 A New Generation of Bragg Polarization Optics in EDXRF

F68 Development Trends in the Design of WDXRF Spectrometers and their Implementation in the New 9900 Thermoarl SIM/SEQ Instrument

F32 Weighing Machine and Flux Dispenser, Theant…Take the Weight Off Your Mind!

F46 Advancements in Portable XRF Instrumentation

F53 An XRF Measuring Platform Utilizing a Miniature X-ray Tube and a Silicon PIN Diode Detector

F33 Multi-Spectral XRF Counting: Squeeze Twice as much Information from Your Detector

D104 Definitive Mineralogical Analysis on Mars Using X-ray Diffraction

D098 The Focusing Mirror: New Possibilities for Transmission Powder XRD

D010 DHS1100—A New High Temperature Stage for Multipurpose 4-Circle X-ray Goniometers

C14 An X-ray Nanodiffraction Technique for Individual Crystalline Nanoobjects

D012 Phase Imaging with an X-ray Talbot Interferometer—Invited

C22 Quantitative Sub-100nm Phase-Contrast Imaging Using an SEM-Based Full-Field X-ray Microscope—Invited

D045 Scientific Applications of Phase-Contrast Diffraction Imaging

D019 Factors Affecting In-Line Phase Contrast Imaging with a Laboratory Microfocus X-ray Source

C01 Time-Resolved X-ray Imaging in Studies of Advanced Alloy Solidification Processes—Invited

Powder Diffraction

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Volume 20 - Issue 2 - June 2005

Denver X-Ray Conference