Symposium M – Fracture & Ductile vs. Brittle Behavior - Theory, Modelling…
Research Article
Fiber Debonding Along a Crack Front in Paper
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- 15 February 2011, 153
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Temperature-Dependent Onset of Yielding in Dislocation-Free Silicon: Evidence of a Brittle-To-Ductile Transition
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- 15 February 2011, 161
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Cross-Sectional and Plan-View Observation of Cracks Introduced in Si at the Ductile-Brittle Transition Temperature
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- 15 February 2011, 169
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Unstable Stacking Fault Free Energies in Silicon through Empirical Modeling
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- 15 February 2011, 175
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Dynamic Crack Propagation in Single-Crystalline Silicon
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- 15 February 2011, 181
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Cracks in Nano-Ceramic thin Layers Produced by Laser Treatments
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- 15 February 2011, 189
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The Fracture of Composite Materials: A Chaotic Approach
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- 15 February 2011, 195
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Long Distance Roughness of Fracture Surfaces in Heterogeneous Materials
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- 15 February 2011, 203
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Molecular Dynamics Studies of Interfacial Crack Propagation in Heterogeneous Media
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- 15 February 2011, 209
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Studies of Crack Pattern in Two Dimensional Media as Resulting From Ion Beam like or Freezing Destruction
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- 15 February 2011, 215
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Analysis of Compression Behavior of a [011] TA Single Crystal with Orientation Imaging Microscopy and Crystal Plasticity
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- 15 February 2011, 221
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Mesoscopic Simulation of Dislocation Activity at Crack Tips
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- 15 February 2011, 233
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Molecular Dynamics Study of Copper and Aluminum under Mechanical Strain
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- 15 February 2011, 245
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Experimental Analysis of Deformation Induced Microstructure Near a Crack Tip in a Hardened Copper Crystal
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- 15 February 2011, 251
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Simulation of Void Growth at High Strain-Rate
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- 15 February 2011, 257
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The Mechanism of Ductile Fracture in Constrained Thin Films
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- 15 February 2011, 263
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Finite Element Analysis of Thermal-Mechanical Stress Induced Failure in Interconnects
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- 15 February 2011, 269
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Quantitative Modeling and Measurement of Copper Thin Film Adhesion
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- 15 February 2011, 277
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Mechanisms of Intergranular Fracture
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- 15 February 2011, 291
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Experiments and Simulations of Directionally dependent Fracture along Copper/Sapphire Interfaces
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- 15 February 2011, 299
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