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Picosecond Decay Dynamics in Porous Silicon

Published online by Cambridge University Press:  28 February 2011

T. Matsumoto
Affiliation:
Electronics Research Laboratories, Nippon Steel Corporation, 5 – 10 – 1 Fuchinobe, Sagamihara, Kanagawa 229, Japan
T. Futagi
Affiliation:
Electronics Research Laboratories, Nippon Steel Corporation, 5 – 10 – 1 Fuchinobe, Sagamihara, Kanagawa 229, Japan
H. Mimura
Affiliation:
Electronics Research Laboratories, Nippon Steel Corporation, 5 – 10 – 1 Fuchinobe, Sagamihara, Kanagawa 229, Japan
Y. Kanemitsu
Affiliation:
Institute of Physics, University of Tsukuba, Tsukuba, Ibaraki 305, Japan
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Abstract

Picosecond decay dynamics of luminescent porous silicon has been studied using the second harmonics (SH) of a cw modelocked YLF laser and a synchroscan streak camera. Picosecond luminescence decay shows nonexponential behavior that becomes large with decreasing emission energy. When increasing hydrogen termination on the surface of a Si microcrystal occurs, this picosecond luminescence decay becomes faster. Our experimental results indicate that there are two luminescent states in porous Si : a weak luminescent quantum confinement state and a strong luminescent surface localized state.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Canham, L. T., Appl. Phys. Lett. 57, 1046 (1990).Google Scholar
2. Cullins, A. G. and Canham, L. T., Nature 353, 335 (1991).Google Scholar
3. Cole, M. W., Harvey, J. F., Lux, R. A., Eckart, D. W., and Tsu, R., Appl. Phys. Lett. 60, 2800 (1992).Google Scholar
4. Lehmann, V. and Gosele, U., Appl. Phys. Lett. 58, 856 (1991).Google Scholar
5. Brandt, M. S., Fuchs, H. D., Stutzmann, M., Weber, J., and Cardona, M., Solid State Commun. 81, 307 (1992).Google Scholar
6. Matsumoto, T., Daimon, M., Futagi, T., and Mimura, H., Jpn. J. Appl. Phys. 31, L619 (1992).Google Scholar
7. Ito, T., Kato, Y., and Hiraki, A., The Structure of Surfaces II, edited by van der Veen, J. F. and Van Hove, M. A. (Springer, Berlin, 1988) p. 378.Google Scholar