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Magnetic and Transport Properties of Ion Beam Sputtered FE/CR Multilayers

Published online by Cambridge University Press:  26 February 2011

K. Inomata
Affiliation:
Toshiba Corporation, Research and Development Center, 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki 210, Japan
S.N. Okuno
Affiliation:
Toshiba Corporation, Research and Development Center, 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki 210, Japan
S. Hashimoto
Affiliation:
Toshiba Corporation, Research and Development Center, 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki 210, Japan
K. Yusu
Affiliation:
Toshiba Corporation, Research and Development Center, 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki 210, Japan
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Abstract

Fe/Cr/Fe sandwiches and (Fe/Cr)n, multilayers were prepared by ion beam sputtering on MgO(100) substrates by changing acceleration voltages. Lower acceleration voltage was crucial to obtain multilayers with high quality interfaces.Single crystalline Fe/Cr/Fe sandwiches were prepared with ambient substrate temperature having a relation of Fe(100)<110>//MgO(100)<lO0>.On the substrates with elevated temperature above 150°C,however,polycrystalline films were grown.Magnetic coupling between Fe-layers through intervening Cr layers was investigated by FMR using 9.4GHz,in which three resonance lines were observed for single crystalline Fe/Cr/Fe sandwiches and (Fe/Cr)n multilayers with antiferromagnetic Fe-layer interactions,while a single resonance line was observed for the polycrystalline films.Magnetoresistance measured on (20AFe/12ACr)5 single crystalline multilayers showed anisotropy in saturation fields Hs which are about 2 times lower in the applied field parallel to Fe<100> than to Fe<l10>,which is consistent with the magnetization process for the films.It was found that the shapes of the magnetoresistance curve vs magnetic field differ for H//Fe<100> and H//Fe<110>.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

1)Baibich, M.N., Broto, J.M., Fert, A., Dau, F. Nguyen van, Petroff, F., Etienne, P., Creuzet, G., Friedderrich, A. and Chazelas, J.:Phys.Rev.Lett. 61,2472 (1988).CrossRefGoogle Scholar
2)Binasch, G., Grunberg, P., Sauerenbach, F. and Zinn, W.:Phys.Rev. B39,4828(1989)Google Scholar
3)Araki, S. and Sinjo, T.:J.Mag.Soc. Japan 14,351(1990).Google Scholar
4)Parkin, S.S.P., More, N. and Roche, K.P.:Phys.Rev.Lett. 64,2304(1990).CrossRefGoogle Scholar
5)Krebs, J.J., Lubitz, P., Chaikien, A. and Prinz, G.A.:Phys.Rev.Lett. 63,1645(1989).CrossRefGoogle Scholar
6)Schmidt, W.:J.Mag.Mag.Mater. 84,119(1990)CrossRefGoogle Scholar
7)Saurenbach, F., Walz, U., Hinchey, L., Grunberg, P. and Zinn, W.:J.Appl.Phys. 63, 3473(1988)Google Scholar