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A Low Electron Voltage Approach to Increase Spatial Resolution of Temperature Mapping in Thermal Scanning Electron Microscopy
Published online by Cambridge University Press: 15 April 2013
Abstract
Thermal scanning electron microscopy is a new temperature mapping technique based on thermal diffuse scattering in electron backscatter diffraction in a scanning electron microscope. It provides both nano-scale resolution and far-field non-contact temperature mapping capabilities no other methods can adequately combine. While a calculated spatial resolution of less than 100 nm has already been realized using 20 keV electrons, lower energy incident electrons should enable still higher spatial resolution (even down to 10 nm). In this paper, the feasibility of this approach is examined.
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- Information
- MRS Online Proceedings Library (OPL) , Volume 1525: Symposium SS – Quantitative In-Situ Electron Microscopy , 2013 , mrsf12-1525-ss06-02
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- Copyright © Materials Research Society 2013