Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-29T07:55:18.214Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Beam Degradation of Sulfide-Based Thin-Film Phosphors for Field Emission Flat Panel Displays

Published online by Cambridge University Press:  10 February 2011

B.L. Abrams ,
T.A. Trottier ,
H.C. Swart ,
E. Lambers  and
P.H. Holloway
B.L. Abrams
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611
T.A. Trottier
Affiliation:
FPDD, Motorola, Inc., 7700 South River Parkway, FPD 22, Tempe, AZ 85284
H.C. Swart
Affiliation:
Department of Physics, University of the Orange Free State, P.O. Box 339, 9300 Bloemfontein, Republic of South Africa
E. Lambers
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611
P.H. Holloway
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611
Get access

Abstract

The change in cathodoluminescence (CL) brightness and changes in surface chemistry of the thin film phosphor, SrS:Ce, have been investigated using a scanning Auger electron spectrometer and an Oriel optical spectrometer. The data for SrS:Ce were compared to ZnS:Cu, Al, Au and Y2O2S:Eu powders all collected in a stainless steel UHV chamber with gas pressures of 10−6 Torr O2. In the presence of a 2kV primary electron beam, the amounts of C and S on the surface decreased while the oxygen concentration increased. As a result, ZnO, Y2O3 and presumably SrOx formed. This change in surface chemistry coincided with a decrease in CL brightness. SrS degraded much faster than ZnS or Y2O2S. The model for this degradation process suggests that the primary electron beam dissociated physisorbed molecules to reactive atomic species. These atomic species reacted with surface S and C, carrying them away and leaving behind an increasingly more impenetrable layer. Threshold voltage experiments were conducted to reveal where it becomes possible to measure the CL. This threshold voltage should be affected by the oxide layer discussed above. The implications for vacuums in an FED FPD will be discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 508: Symposium B – Flat Panel Display Materials - 1998 , January 1998 , 261
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Holloway, P.H. Trottier, T.A., Sebastian, J., Jones, S., Zhang, X.-M, Bang, J.-S, Abrams, B., Thomes, W. and Kim, T.-J, J.SID, In Press.Google Scholar
2. Itoh, S., Kimizuko, T. and Tonegawa, T., J. Electrochem. Soc. 136, p.1819–18213 (1989).Google Scholar
3. Kingsley, J.D. and Prener, J.S., J. Appl. Phys. 43, p.3073 (1972)Google Scholar
4. Trottier, T.A., Swart, H.C., Jones, S. and Holloway, P.H., J.Soc.Inf.Display, 4, p.354 (1996).Google Scholar
5. Oosthuizen, L., Swart, H., Viljoen, P., Holloway, P. and Bernin, G., Appl.Surf.Sci., 120, p.9(1997).Google Scholar
6. Swart, H., Sebastian, J., Trottier, T., Jones, S. and Holloway, P., J.Vac.Sci.Technol., 14, p.1697 (1996).Google Scholar
7. Trottier, T.A., Characterization of the Cathodoluminescent Degradation of YooS:Eu Powder CRT Phosphor, PhD Dissertation, University of Florida, 1997.Google Scholar
8. Trottier, T.A., J.SID., In Press.Google Scholar