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Dynamic Redistribution of Excess Charge During Photoemission in an Electron Bombarded Glass-Ceramic

Published online by Cambridge University Press:  28 February 2011

D. L. Carroll ,
D. L. Doering  and
B. S. Blais
D. L. Carroll
Affiliation:
Department of Physics, Wesleyan University, Middletown CT 06459–0155
D. L. Doering
Affiliation:
Department of Physics, Wesleyan University, Middletown CT 06459–0155
B. S. Blais
Affiliation:
Department of Physics, Wesleyan University, Middletown CT 06459–0155
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Abstract

We have measured the energy distribution of excess charge trapped by an electron irradiated mica-glass ceramic, Macor™. Photoelectron emission as a function of incident wavelength shows two distinctly different contributions to the measured density of electron trap states. First, there is a broad continuum of binding states which extends well above the Fermi level. This results in spontaneous electron emission which depletes the excess charge in these states rapidly at room temperature and more slowly at 170K. The free decay of charge emission can be described semiclassically. Second, localized trap states appear as peaks on the continuum distribution which occur at 2.7 and 3.1 eV. These correspond to two thermionic emission peaks which occur during heating at 550K and 595K respectively. Photoemission at high intensities using the 458, 488, and 514 nm wavelengths of an argon ion laser and the 632 nm wavelength of a He-Ne laser greatly enhances the depletion of excess charge from the sample. The laser-induced emission intensity is initially high and drops rapidly, followed by a more gradual decrease. The initial intensity measures the population of electrons with binding energies less than the photon energy. The later emission is related to the repopulation of these states by the dynamic redistribution of electrons from deeper states. This behavior may lead to a model for the mechanism of electron redistribution in charged insulating materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 235: Symposium A – Phase Formation and Modification by Beam-Solid Interactions , 1991 , 395
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Gerhard-Multhaupt, R., Haardt, M., Eisenmenger, W. and Sessler, G.M., J. Phys: D Appl. Phys. 16, 2247 (1983).Google Scholar
2. Gross, B., Sessler, G.M., and West, J.E., J. Appl. Phys. 48, 4303 (1977).CrossRefGoogle Scholar
3. Arkhipov, V.I., Rudenko, A.I., and Sessler, G.M., J. Phys. D: Appl. Phys. 24, 731 (1991).CrossRefGoogle Scholar
4. Berkley, D. A., J. Appl. Phys. 50, 3447 (1979).CrossRefGoogle Scholar
5. Lowell, J. and Truscott, W.S., J. Phys D: Appl. Phys. 19, 1281 (1986).Google Scholar
6. Carroll, D.L., Doering, D.L., and Blais, B.S., J. Vac. Sci. and Technol. A (in press).Google Scholar
7. Xiong-Skiba, P., Carroll, D.L., and Doering, D.L., J. Vac. Sci. Technol. A 8, 1549 (1990).Google Scholar
8. Chyung, K., Beall, G.H., and Grossman, D.G., in Proceedings of the Tenth International Congress on Glass, published by The Ceramic Society of Japan, July 1974.Google Scholar
9. Gross, B., Sessler, G.M., and West, J.E., J. Appl. Phys. 45, 2841 (1974).Google Scholar
10. Rose, A., Phys. Rev. 97, 322 (1955).CrossRefGoogle Scholar
11. Nanto, H. and Kawanishi, M., Surface Sci. 86, 743 (1979).Google Scholar
12. Young, J. F. and Williams, D., J. Appl. Phys. 34, 3157 (1963).Google Scholar
13. Kortov, V. S., in Proc. of the Ninth Intern. Symp. on Exoelectron Emission and Appl., Eds. Sujak, B., Scharmann, A., Gieroszynska, K. and Gieroszynski, A., pp. 5 (1988).Google Scholar