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The Crystalline-To-Amorphous Phase Transition In Irradiated Silicon

Published online by Cambridge University Press:  26 February 2011

D.N. Seidman
Affiliation:
Northwestern University, Materials Science Dept., Evanston, IL 60201 Argonne National Laboratory, Materials Science and Technology Division, Argonne, IL 60439
R.S. Averback
Affiliation:
Argonne National Laboratory, Materials Science and Technology Division, Argonne, IL 60439
P.R. Okamoto
Affiliation:
Argonne National Laboratory, Materials Science and Technology Division, Argonne, IL 60439
A.C. Baily
Affiliation:
Northwestern University, Materials Science Dept., Evanston, IL 60201 Argonne National Laboratory, Materials Science and Technology Division, Argonne, IL 60439
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Abstract

The amorphous(a)-to-crystalline (c) phase transition has been studied in electron(e-) and/or ion irradiated silicon (Si). The irradiations were performed in i n the Argonne High Voltage Microscope-Tandem Facility The irradia ion of Si, at <10 K, with 1-MeV e- to a fluence of 14 dpa failed to induce the c-to-a transition. Whereas an irradiation, at <10 K, with 1.0 or 1.5-MeV Kr+ ions induced the c-to-a transition by a fluence of ≈0.37 dpa. Alternatively a dual irradiation, at 10 K, with 1.0-MeV e and 1.0 or 1.5-MeV Kr+ to a Kr+ fluence of 1.5 dpa -- where the ratio of the displacement rates for e- to ions was ≈0.5--resulted in the Si specimen retaining a degree of crystallinity. These results are discussed in terms of the degree of dispersion of point defects in the primary state of radiation damage and the mobilities of point defects.

Type
Research Article
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1. Vook, F.L. and Stein, H.J., Radiat. Effects 2. 23 (1969).Google Scholar
2. Morehead, F. F. Jr and Crowder, B.L., Radiat. Effects 127 (1970).Google Scholar
3. Chadderton, L.T., Radiat. Effects 8, 77 (1971).Google Scholar
4. Swanson, M.L., Parsons, J.R. and Hoelke, C.W., Radiat. Effects 9, 249 (1971).Google Scholar
5. Gibbons, J.F., Proc. IEEE, 60,1062 (1972).Google Scholar
6. Dennis, J.R. and Hale, E.B., Radiat. Effects 30, 219 (1976); J. Appl. Phys 49. 1119 (1978).Google Scholar
7. Nelson, R.S., Radiat. Effects 32, 19 (1977).Google Scholar
8. Cembali, F., Dori, L., Galloni, R., Servidori, M. and Zignani, F., Radiat. Effects 36, 111 (1978).Google Scholar
9. Sobolev, N.A., Gótz, G., Karthe, W. and Schnabel, B., Radiat. Effects 42 23 (1979).Google Scholar
10. Kalish, R., Bernstein, T., Shapiro, B. and Talmi, A., Radiat. Effects 52 153 (1980).Google Scholar
11. Webb, R.P. and Carter, G., Radiat. Effects 59 69 (1981).Google Scholar
12. Corbett, J.W., Karins, J.P. and Tan, T.Y., Nucl. Instum. & Meth. 182/183, 457 (1981).Google Scholar
13. Corbett, J.W., Solid State Physics:Suppl.7 (Academic Press, New York, 1966),Chapt. 1, pp.15; M.W. Thompson,Defects and Radiation 355 Damage in Metals (Cambridge Press, England, 1969),Chapt. 4, pp. 89-142.Google Scholar
14. Brinkman, J.A., Am. J. Phys. 24, 246 (1956).Google Scholar
15. Okamoto, P.R. and Lam, N.Q., Mat. Res. Soc. Sympos. Proc. 41 241 (1985).Google Scholar
16. Föll, H., Inst. Phys. Conf. Ser. 23, 233 (1975).Google Scholar
17. Corbett, J.W. and Bourgoin, J.C., Trans. IEEE NS–18, 11 (1971).Google Scholar
18. Bourgoin, J.C. and Corbett, J.W., Phys. Lett. 3A, 135 (1972).Google Scholar
19. Wei, C.-Y. and Seidman, D.N., Appl. Phys. Lett. 34, 622 (1979); C.-Y. Wei,M.l. Current and D.N. Seidman, Philos. Mag. A, 44, 459 (1981); M.I. Current, C.-Y. Wei and D.N. Seidman, Philos. Mag. A, 47. 407 (1983).Google Scholar
20. Averback, R.S., Bendek, R., Merkle, K.L., Sprinkle, J. and Thompson, L.J., J. Nucl. Mater. 113 211 (1983).Google Scholar
21. Beaven, L.A., Scanlan, R.M. and Seidman, D.N., Acta Metall. 19, 1339 (1971); C.-Y. Wei and D.N. Seidman, Philos. Mag. A, 43,1419 (1981).Google Scholar