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Analysis of Scanning Tunneling Microscope Topographs of Graphite Surfaces Roughened by Ar+ Ion Bombardment

Published online by Cambridge University Press:  25 February 2011

Elliott A. Eklund ,
R. Stanley Williams  and
Eric J. Snyder
Elliott A. Eklund
Affiliation:
Department of Physics and Solid State Science Center, University of California Los Angeles, CA 90024–1 547
R. Stanley Williams
Affiliation:
Department of Chemistry and Biochemistry, University of California Los Angeles, CA 90024–1 569
Eric J. Snyder
Affiliation:
Department of Chemistry and Biochemistry, University of California Los Angeles, CA 90024–1 569
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Abstract

The scanning tunneling microscope (STM) has been used to investigate graphite surfaces roughened by 5 keV Ar+ ion bombardment. The (0001) surfaces of several samples were etched with the same total ion dose but with different sputter rates for each surface. STM images taken after sputtering show that the roughness of the sputtered surfaces depended on the sputter rate and that the surface topography of each sample appeared self-similar over a large range of length scales. These experimental observations agree with predictions of the recently proposed Shadow Model. The two dimensional height-height correlation function is utilized as a means of quantitative analysis for STM topographs of sputtered surfaces.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 157: Symposium A – Beam-Solid Interactions: Physical Phenomena , 1989 , 305
Copyright
Copyright © Materials Research Society 1990

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References

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