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Structural Study of CIGS2 Thin Film Absorbers using EBSD Technique

Published online by Cambridge University Press:  20 June 2011

Ashwani Kaul ,
Shirish A. Pethe ,
Neelkanth G. Dhere  and
Helio R. Moutinho
Ashwani Kaul
Affiliation:
Florida Solar Energy Center, 1679 Clearlake Road, Cocoa, FL 32922, U.S.A.
Shirish A. Pethe
Affiliation:
Florida Solar Energy Center, 1679 Clearlake Road, Cocoa, FL 32922, U.S.A.
Neelkanth G. Dhere
Affiliation:
Florida Solar Energy Center, 1679 Clearlake Road, Cocoa, FL 32922, U.S.A.
Helio R. Moutinho
Affiliation:
National Renewable Energy Laboratory, Golden, CO, U.S.A.
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Abstract

In this study electron backscatter diffraction (EBSD) investigation is carried out for CuIn1-xGaXS2 (CIGS2) samples that were prepared by two stage process in which the initial precursor was deposited by DC magnetron sputtering followed by sulfurization in conventional furnace. Due to high surface roughness, low quality EBSD signal was obtained in the samples that were initially polished with ion milling. Polishing with dimpler grinder followed by chemical treatment with bromine/methanol solution improved the quality of EBSD patterns. Efforts are being made to build the database for CIGS2 in the system using high quality EBSD patterns and finally to obtain grain orientation maps.

Keywords

thin filmsputteringphotovoltaic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1323: Symposium C – Advanced Materials Processing for Scalable Solar-Cell Manufacturing , 2011 , mrss11-1323-c03-44
Copyright
Copyright © Materials Research Society 2011

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References

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