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Creep-Fatigue Behavior of Microelectronic Solder Joints

Published online by Cambridge University Press:  15 February 2011

R. G. Ross Jr ,
L. C. Wen ,
G. R. Mon ,
E. Jetter  and
J. Winslow
R. G. Ross Jr
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
L. C. Wen
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
G. R. Mon
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
E. Jetter
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
J. Winslow
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
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Abstract

Even at room temperature, solder joints exhibit both creep and fatigue behavior that is strongly dependent on solder joint configuration, the thermal environment, and the solder alloy properties. The microstructures of solder joints with up to 25 years of aging have been studied using SEM/EDS and metallographic techniques. Data are presented on grain growth and metallurgical composition versus aging time. A special non-linear finite element creep-fatigue simulation model has been developed, based on measured strain-rate hardness relationships, and used to analytically predict the effects of observed metallurgical changes and the effects of lead stiffness in solder joint creepfatigue interaction. To corroborate the analytical results, a special bi-metallic test fixture has been developed to accelerate the thermo-mechanical loading of solder joints in thermal cycling environments. Measured time-to-failure data for various electronicpackage lead configurations/stiffnesses, including gullwing and J-lead, are presented and shown to be in reasonable agreement with the analytical results.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 225: Symposium G – Materials Reliability Issues in Microelectronics , 1991 , 187
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

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