Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-29T09:10:38.907Z Has data issue: false hasContentIssue false

Combinatorial Synthesis Approach for Optimizing Oxide/Si Interfaces for the Future Ulsi

Published online by Cambridge University Press:  17 March 2011

T. Chikyow
Affiliation:
COMET-NIMS,National Institute for Material Science 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 Japan e-mail: [email protected]
P. Ahmet
Affiliation:
COMET-NIMS,National Institute for Material Science 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 Japan e-mail: [email protected]
T. Naruke
Affiliation:
COMET-NIMS,National Institute for Material Science 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 Japan e-mail: [email protected]
K. Nakajima
Affiliation:
COMET-NIMS,National Institute for Material Science 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 Japan e-mail: [email protected]
N. Okazaki
Affiliation:
COMET-NIMS,National Institute for Material Science 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 Japan e-mail: [email protected]
K. Hasegawa
Affiliation:
Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259 Nagatsuda, Midori-ku, Yokohama, Kanagawa, 226-8503, Japan
H. Minami
Affiliation:
Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259 Nagatsuda, Midori-ku, Yokohama, Kanagawa, 226-8503, Japan
K. Itaka
Affiliation:
Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259 Nagatsuda, Midori-ku, Yokohama, Kanagawa, 226-8503, Japan
T. Koida
Affiliation:
Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259 Nagatsuda, Midori-ku, Yokohama, Kanagawa, 226-8503, Japan
J.H. Song
Affiliation:
Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259 Nagatsuda, Midori-ku, Yokohama, Kanagawa, 226-8503, Japan
M. Yoshimoto
Affiliation:
Ceramic Materials and Structure Laboratory Tokyo Institute of Technology 4259 Nagatsuda, Midori-ku, Yokohama, Kanagawa 226-8503, Japan.
T. Hasegawa
Affiliation:
Ceramic Materials and Structure Laboratory Tokyo Institute of Technology 4259 Nagatsuda, Midori-ku, Yokohama, Kanagawa 226-8503, Japan.
M. Kawasaki
Affiliation:
Institute for Metal Research, Tohoku University 2-1-1 Katahita, Aoba-ku, Sendai 980-8577, Miyagi, Japan.
H. Koinima
Affiliation:
Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259 Nagatsuda, Midori-ku, Yokohama, Kanagawa, 226-8503, Japan COMET-NIMS, National Institute for Material Science 1-1Namiki, Tsukuba, Ibaraki 305-0044, Japan
Get access

Abstract

A combinatorial material synthesis with temperature gradient heating system was employed to optimizing growth parameters for oxide growth on Si substrate. From the obtained results, it was found the dielectric property depends on the growth temperature as well as the composition. The interface structures were investigated by high resolution electron microscopy with a series of specimens fabricated by micro sampling method. The results showed that amorphous oxide region and SiO2 layer were formed at the interface. It was speculated that the amorphous oxide region contributed to the reduction of the dielectric property. To avoid the amorphous and SiO2 formation at the oxide/Si interface, a few kinds of intermediate layers were inserted and tested to find the possibility of abrupt interface formation.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1) For example, see “The National Technology Roadmap for Semiconductor (SIA, Semiconductor Industry Association)” p13.Google Scholar
2) ZrO2:Kransnosvodtsev, S.I. and Pechen, E.V., Physica C 185/187 2097 (1991). HfO2: R. de Reus, F.W. Saris, G.J. van der Kolk, C. Wittmer, B.Dam, D.H.A. Blank, D.J. Adelerhof, and J. Flokstra,Mater, Sci Engr.B7 135 (1990).Google Scholar
3) McKee, R.A., Walker, F.J. and Chisholm, M.F., Phys.Rev.Lett., 81 3014 (1998).Google Scholar
4) Chikyow, T., Bedair, S.M., Tye, L.A., and El-Masry, N.A., Appl.Phys.Lett., 60 1030 (1994).Google Scholar
5) Hubbard, K.J. and Schlom, D.G., J.Mater.Res., 11 2757 (1996).Google Scholar
6) Chambers, S.A., Liang, Y., Yu, Z., Droopad, R., Ramdani, J., and Eisenbeiser, K., Appl.Phys.Lett., 77 11 (2000).Google Scholar
7) For example,Shinriki, H., Nakata, M., Nishioka, Y., and Mukai, K., IEEE Electron Device Lett., 10 514 (1989).Google Scholar
8) R. van Dover and Schneemeyer, L.F.,IEEE Electron Device Lett.,19 329 (1998).Google Scholar
9) Chikyow, T. and Koguchi, N., J.Vac.Sci and Technol B16 2538 (1998).Google Scholar
10) For example, Bringans, R.D., Uhrberg, R.I.G.,Olmstead, M.A. and Bachrach, R.Z., Phys Rev. B36 9569 (1987). P. Kreager and J. Pollman, Phys.Rev.B47 1898 (1993).Google Scholar
11) Chikyow, T., Takakura, M., Yoshimoto, M. and Koinuma, H. to appear in Physica C.Google Scholar
12) For example,Bednorz, J.B. and Muller, K.A., Z Phys.,B64 189 (1986).Google Scholar
13) For example, Pearsall, T.P.: “GaInAsP aAlloy Laser (John Wiley & Sons, 1982)” Chap.8.Google Scholar
14) Xiang, X.D., Annu.Rev.Mater.Sci.,29 149 (1999).Google Scholar
15) Lippmaa, M. and Kawasaki, M. to appear in the Physica Kawasaki, C. et al reported the “Parallel synthesis and high-throughtput characterization of Oxide superlattice” in the SPIE “Combinatorial and Composition Spread. Techniques in the Materials and Device Development”, in 2000.Google Scholar
16) Matsumoto, Y., Murakami, M., Shono, T., Hasegawa, T., Fukumura, T., Kawasaki, M., Ahmet, P., Chikyow, T., Koshihara, S., and Koinuma, H., Science 291 854 (2001).Google Scholar
17) Dover, R. van and Schneemeyer, L.F., IEEE Electron Device Lett., 19 329 (1998).Google Scholar
18) Shannon, R.D. J.Appl.Phys., 73 1 (1993).Google Scholar
19) Moll, L. and Tarui, Y., IEEE Trans.Elect.Dev. ED–10, 338 (1963).Google Scholar
20) Hitachi Co.Ltd.product. Umemura and Kakibayashi,:private communication.Google Scholar
21) For example,Bednorz, J.B. and Muller, K.A., Z Phys., B64 189 (1986).Google Scholar
22) For example, Pearsall, T.P.: “GaInAsP aAlloy Laser (John Wiley & Sons, 1982)” Chap.8.Google Scholar
23) Ahmet, P., Koida, T., Takakura, M., Yoshimoto, M., Tanaka, M., Tkaguchi, M., Koinuma, H. and Chikyow, T. et al to appear in the Applied Surface Science.Google Scholar