Historically, most SEM operators used accelerating voltages that were fairly high, quite often in the range of 15–20 kV. Now progress in electron optics has made low-voltage observations a routine mode of SEM operation. The greatly improved range of utilized accelerating voltages provides the SEM operator with additional flexibility and with additional responsibilities for choosing the right SEM settings for image acquisition.

Selected postings from the Microscopy Listserver from December 1, 2009 to January 31, 2010. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

Selected postings from the Microscopy Listserver from February 1, 2010 to April 1, 2010. Complete listings and subscription information can be obtained at http://http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

Selected postings from the Microscopy Listserver from May 1, 2010 to June 30, 2010. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

Selected postings from the Microscopy Listserver from July 1, 2010 to August 31, 2010. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

Selected postings from the Microscopy Listserver from October 11, 2009 to November 30, 2009. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

Following is a list of microscopy related meetings and courses. The editors would greatly appreciate input to this list via the electronic submission form found in the MSA World-Wide Web page at http://www.msa.microscopy.com. We will gladly add hypertext links to the notice on the web and insert a listing of the meeting in the next issue of the Journal. Send comments and questions to Nan Yao, [email protected].

In the March issue of Microscopy Today, I perpetrated a trick on the reader. I proposed a new way to operate a transmission electron microscope, claiming that it would achieve an order of magnitude improvement in resolution—knowing that the idea would not work. A prize was offered (in a “Note Added in Proof,” separate from the main article) for the best explanation as to why it would not work. Only one entry for the competition was submitted, and that was not—as far as I can tell—a serious attempt to show why the proposal would not work.

Having trouble sleeping at night worrying about technique? Can't seem to find the right words to say to your technicians? Let Abbe have a whack at it. What could go wrong? Send your posers to his assistant at [email protected].

Ask Herr Abbe your burning questions at [email protected].