The field of electron microscopy, by its diverse nature, abounds with acronyms: AEM, EF-TEM, ESEM, FE-SEM, HREM, HRTEM, HVEM, SEM, STEM, TEM, and VP-SEM, to name a few of the instruments. Add in the different forms of data that these instruments might collect, and it can be overwhelming: ADF, BF, BSE, CBED, CL, DF, EBIC, EBSD/BEKP/BKD/EBSP, ECCI, EDS/EDX, EELS, HAADF, NBD, SAD, and SE. For the brave reader, check out the acronym listing at the beginning of DB Williams and CB Carter's series on TEM.