Many researchers view microanalysis as the determination of composition and structure of individual phases at a spatial resolution of 1 μm or better. It is remarkable to me that much of what we know about the phases shown in equilibrium phase diagrams was determined using bulk analysis techniques like powder X-ray diffraction in combination with light microscopy of flat-polished sections of materials. The identities and amounts of phases were deduced from systematic experiments because there was no way to analyze micrometer-sized phases in situ.

The ability to determine the age of commercially important aquatic species is important to managing their populations. Whereas the age of most aquatic animals can be found by counting annual growth bands in hard structures, such as the fish otoliths (stone-like structures in the ear that are important for balance and orientation) and bivalves' shells, a technique to directly and accurately age individual crustaceans does not exist. At least it didn't until the recent study by Raouf Kilada, Bernard Sainte-Marie, Rémy Rochette, Neill Davis, Caroline Vanier, and Steven Campana. This is a bit of surprise because nothing equivalent to the hard structures of fish or bivalves had been found, or even expected to exist, in crustaceans. This is simply because this group of animals grow by molting or by shedding off their skins. Not only does molting frequency vary considerably among species of crustaceans, but molting individuals are assumed to lose and replace all calcified structures, including the cuticle (exoskeleton), that might record annual growth.

The electron probe microanalyzer (EPMA) provides quantitative analysis for nearly all chemical elements with a spatial resolution of analysis about ~1 μm, which is relevant to microstructures in a wide variety of materials and mineral specimens. Recent implementation of the Schottky emitter field-emission gun (FEG) electron source in the EPMA has significantly improved the spatial resolution and detectability of the EPMA technique.

We demonstrate in this article an exciting new method for obtaining electron Kikuchi diffraction patterns in transmission from thin specimens in a scanning electron microscope (SEM) fitted with a conventional electron backscattered diffraction (EBSD) detector. We have labeled the method transmission EBSD (t-EBSD) because it uses off-the-shelf commercial EBSD equipment to capture the diffraction patterns and also to differentiate it from transmission Kikuchi diffraction available in the transmission electron microscope (TEM). Lateral spatial resolution of less than 10 nm has been demonstrated for particles and better than 5 nm for orientation mapping of thin films. The only new requirement is a specimen holder that allows the transmitted electrons diffracted from an electron transparent sample to intersect the EBSD detector. We briefly outline our development of the technique, followed by descriptions of sample preparation techniques and operating conditions. We then present examples of t-EBSD patterns from a variety of specimens, including particles of diameter <10 nm, wires of diameter <80 nm, and films with thicknesses from ~5 nm to 300 nm. Finally, we discuss the phenomenon in the context of Monte Carlo electron scattering simulations.

Traditional electron detectors for scanning electron microscopes (SEMs) are the Everhart-Thornley detector located on one side of the specimen and the overhead backscattered electron detector (BSED), usually mounted under the final lens. In 2011 PulseTor introduced an efficient BSED based on scintillator/silicon photomultipler technology that is small enough to be mounted on the tip of an X-ray detector. The scintillator converts the electron signal to light, which is in turn converted to an electrical current in the silicon photomultiplier (SiPM). Silicon photomultipliers were initially developed in Russia in the 1990s. The review article by Dolgoshein et al. cites much of the historical development. Following the recent work of Piemonte and others, the SiPM consists of an array of many identical and independent detecting elements (microcells) connected in parallel on a common Si substrate. Each microcell is an avalanche photodiode only tens of micrometers in size.

The present article presents a new concept for a light optical field microscope developed after two decades of attempts to find a portable, yet versatile and capable, instrument for extra-laboratory research. Emphasis was put on a portable microscope with polarizing capabilities, yet versatile enough to perform in other configurations. After testing almost every available model made during the last century, the Goren microscope, as it is called now, was developed and tested in various field conditions. The new design, fashioned as two prototypes, is expected to be inexpensive if commercially produced. Still, it can be readily modified to perform as a bright-field, dark-field, phase-contrast, or polarizing instrument. The historical background of field microscopes is briefly presented in context of this new invention.

Failure analysis is important in determining root cause for appropriate corrective action. In order to perform failure analysis of microelectronic application-specific integrated circuits (ASICs) delidding the device is often required. However, determining root cause from the front side is not always possible due to shadowing effects caused by the ASIC metal interconnects. Therefore, back-side polishing is used to reveal an unobstructed view of the ASIC silicon transistors. This paper details how back-side polishing in conjunction with laser-scanned imaging (LSI), laser voltage imaging (LVI), laser voltage probing (LVP), photon emission microscopy (PEM), and laser-assisted device alterations (LADA) were used to uncover the root cause of failure of two ASICs.

In our Core Facility, we are presented with a wide variety of tissue and sample types to process for TEM observation. Some tissues, such as liver, do not present orientation problems. Other tissues such as skeletal muscle have specific orientations that must be maintained. As long as the initial dissection of the tissue is done so that the orientation or area of interest can be identified, these samples do not present a problem. Likewise, when it is not necessary to maintain orientation, cells in culture can be treated with trypsin, to release them from the plate, and pelleted. Or the monolayer can be fixed in vitro and then scraped and pelleted, and the pellet can be processed while adherent to the wall of the Eppendorf tube or handled like a small piece of tissue, among other methods.

As I have been listening to the previous speakers, I have been thinking through my slides. We easily could talk about the Major Research Instrumentation (MRI) program for an hour. So during my time, I will run through the rules of road and things you can do to increase your chances of success and the caveats that go with that. My big take-home message is that this is not something where you can just read the MRI solicitation beforehand and write a good proposal. You really have to think about this and do your homework. Get to know program officers and understand the program. I will try to show you enough of the nuances of the program so that it will encourage you to do that. I'll show you some of the pitfalls, and you'll be able to see you need more information. We're in Arlington, VA, and the old-fashioned way to do this was to go visit us in the NSF building; however we have technology to do that now. We have websites, webcasts (one will be held in December), phone calls, etc. There are a lot of ways to electronically reach out and get information.

In the early twentieth century, the long standing argument about whether the character of light was particle-based or wavelike was finally coming to an end as the scientists of the day began to accept that light could assume a dual nature. The possibility that such a duality might apply to matter as well as light was first proposed by physicist Louis de Broglie. Born in Dieppe, France, de Broglie studied in Paris and was descended from members of the French nobility. In his youth, he considered a career as a diplomat but later turned to science and pursued the study of theoretical physics. His brother, Maurice, who had also decided to become a physicist and made many advances in the study of X rays, reportedly had a considerable influence on de Broglie and was the first to introduce him to the work of Albert Einstein and Max Planck.

Selected postings from the Microscopy Listserver from January 1, 2012 to February 28, 2012. Complete listings and subscription information can be obtained at http://www.microscopy.com. Postings may have been edited to conserve space or for clarity.

Following is a list of microscopy related meetings and courses. The editors would greatly appreciate input to this list via the electronic submission form under “events/other microscopy events” at the MSA webpage: www.microscopy.org. We will gladly add hypertext links to the notice on the web and insert a listing of the meeting in the next issue.

At our last microscopy society council meeting, the Mac users were having trouble finding the appropriate adaptors or “dongles.” This ended up as a comparison of their “thingies” (as they put it) to see which would work and then a comparison of the ages of their “thingies.” I find this trend to compare and discuss “thingies” out in the open to be disturbing. Is there any way to curb this behavior?