Hostname: page-component-77c89778f8-cnmwb Total loading time: 0 Render date: 2024-07-16T21:59:52.688Z Has data issue: false hasContentIssue false
  • English
  • Français

Spatial Resolution in ACOM - What Will Come After EBSD

Published online by Cambridge University Press:  14 March 2018

R.A. Schwarzer
R.A. Schwarzer*
Affiliation:
Kappstr. 65, D-71083 Herrenberg, Germany
*
[email protected]

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Automated Crystal Orientation Microscopy (ACOM) on a grain specific level has proved to be an invaluable new tool for characterizing polycrystalline materials. It is usually based on scanning facilities using electron diffraction , due to its high sensitivity and spatial resolution, but also attempts have been made which rely upon X-ray or hard synchrotron radiation diffraction. The grain orientations are commonly mapped in pseudo-colors on the scanning grid to construct Crystal Orientation Maps (COM), which represent “images” of the microstructure with the advantage of providing quantitative orientation contrast. In a similar way, misorientations across grain boundaries, Σ values of grain boundaries, or other microstructural characteristics are visualized by mapping the grains in the micrograph with specific colors. The principal objectives are the determination of quantitative, statistically meaningful data sets of crystal orientations, misorientations, the CSL character (Σ) of grain boundaries, local crystal texture (pole figures, ODF, MODF, OCF) and derived entities, phase discrimination and phase identification.

Type
Research Article
Information
Microscopy Today , Volume 16 , Issue 1 , January 2008 , pp. 34 - 37
Copyright
Copyright © Microscopy Society of America 2008

References

[1] Schwarzer, R. A. : The determination of local texture by electron diffraction - a tutorial review. Textures and Microstructures 20 (1993) 7-27.CrossRefGoogle Scholar
[2] Schwarzer, R. A. : Automated crystal lattice orientation mapping using a computer-controlled SEM. Micron 28 (1997) 249-265.CrossRefGoogle Scholar
[3] Nelson, R. S. : Proton scattering microscopy. Phil. Mag. (8) 15 (1967) 845-854 CrossRefGoogle Scholar
[4] Livesey, R. G. : A 30 keV instrument for ion surface interaction studies. Vacuum 22 (1972) 595-597.Google Scholar
[5] Barrett, C. S., Barrett, M. A., Mueller, R. M., and White, W. : Identification of silicon carbide phases by proton blocking patterns. J. Appl. Phys. 41 (1970) 2727-2728.Google Scholar
[6] Tondare, V. N. : Quest for high brightness, monochromatic noble gas ion sources. J. Vac. Soc. Techn. A 23 (2005) 1498-1508.CrossRefGoogle Scholar
[7] Ward, B. W., Farkas, L., Notte, J. A., and Percival, R. G. : Systems and methods for a gas field ionization source. US Patent 2007/0228287 A1.Google Scholar
[8] Morgan, J., Notte, J., Hill, R. and Ward:, B. An introduction to the helium ion microscope. Microscopy Today 14#4 (2006) 24-31.Google Scholar
[9] Wenck, U. and Nolze, G. : FIB milling and channeling. GIT Imaging and Microscopy 9/3 (2007) 34-36.Google Scholar
[10] Chadderton, L. T. : A correspondence principle for the channelling of fast charged particles. Phil. Mag. (8) 18 (1968) 1017-1031.Google Scholar
[11] Schwarzer, R. : Patent pending.Google Scholar
[12] Scipioni, L., Stern, L. and Notte:, J. Applications of the helium ion microscope. Microscopy Today 15#6 (2007) 12-15.CrossRefGoogle Scholar
[13] Schwarzer, R. and Gaukler, K. H. : Erzeugung einer Ionen-Mikrosonde mittels Feld ionisation und Emissions linse. Vakuum-Technik 27 (1978) 2-5.Google Scholar