Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-07-03T12:15:50.467Z Has data issue: false hasContentIssue false
  • English
  • Français

A Silicon Multi-Cathode Detector For Microanalysis Applications

Published online by Cambridge University Press:  14 March 2018

Shaul Barkan ,
Liangyuan Feng ,
Jan S. Iwanczyk ,
Bradley E. Patt ,
Carolyn R. Tull ,
Dale E. Newbury  and
John A. Small
Shaul Barkan
Affiliation:
Radiant Detector Technologies, LLC
Liangyuan Feng
Affiliation:
Radiant Detector Technologies, LLC
Jan S. Iwanczyk
Affiliation:
Photon Imaging, Inc.
Bradley E. Patt
Affiliation:
Photon Imaging, Inc.
Carolyn R. Tull
Affiliation:
Photon Imaging, Inc.
Dale E. Newbury
Affiliation:
National Institute of Standards & Technology
John A. Small
Affiliation:
National Institute of Standards & Technology

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

A new class of silicon multi-cathode detector (SMCD) has been developed for microanaiysis spectrometry applications. The detector has excellent energy resolution (< 150 eV FWHM) and high count rate capability (>1 Mcps). An energy resolution of 143 eV FWHM at 5.9 keV was measured with the SMCD at 6 μs peaking time.

Type
Research Article
Information
Microscopy Today , Volume 11 , Issue 5 , August 2003 , pp. 24 - 25
Copyright
Copyright © Microscopy Society of America 2003

References

1. Iwanczyk, Patt, B.E., Tull, C.R., Segal, J., Kenney, C., Bradley, J., Hedman, B. and Hodgson, K.O. , “Large area silicon drift detectors for x-rays - new results”. IEEE Trans. Nucl. Sci, vol. 46 (1999) 284–288.Google Scholar
2. Barkan, S., Iwanczyk, J.S., Patt, B.E. . Feng, L. , Tull, C.R. and Vilkelis, G., “Vortex™-A new high performance silicon drift detector for XRD and XRF Applications”, presented at the Denver X-Ray Conference, Aug. 2002, Denver CO, to be published In Advances In X-Ray Analysis Vol 46 (2003).Google Scholar
3. J.S., Iwanczyk, Patt, B.E, Feng, L, Barkan, S, Tull, C.R.; “High Throughput, High Resolution Silicon Drift Detectors for X-Rays ”, Presented at the IEEE Nucl. Sci. and Med. Imaging Symposium, Norfolk VA Nov. 2002: submitted to IEEE Trans. Nucl. Sci. Vol. 50 (2003)Google Scholar