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Easy Guide to Calibrating TEM's and STEM's

Published online by Cambridge University Press:  14 March 2018

John McCaffrey
John McCaffrey*
Affiliation:
Norrox Scientific Ltd. Ottawa, Canada
*
[email protected]

Extract

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This guide provides an introduction to calibrating transmission electron microscopes (TEM's) and scanning transmission electron microscopes (STEM's), as well as (S) TEM's - instruments that can perform in both modes. While not technically correct, all these instruments will be collectively referred to as TEM's for the rest of this Guide. As with most things, there is a wealth of interesting facts and insights to be discovered by exploring this topic further. More detailed explanations can be found in the classic monographs by Edington or in textbooks such as Williams and Carter.

Type
Research Article
Information
Microscopy Today , Volume 13 , Issue 4 , July 2005 , pp. 28 - 35
Copyright
Copyright © Microscopy Society of America 2005

References

[1] Edington, J.W., Practical Electron Microscopy in Materials Science , Van Nostrand Reinhold, New York (1076).Google Scholar
[2] Williams, D.B. and Carter, C.B., Transmission electron Microscopy, Plenum Press, New York (1996).Google Scholar
[3] CRC Handbook of Chemistry and Physics, CRC Press, Inc., Raton, Boca, Florida 33431 (any year)Google Scholar