It is my pleasure to welcome you to Microscopy and Microanalysis 2002, jointly sponsored by the Microscopy Society of America, Microbeam Analysis Society, Microscopy Society of Canada/Société de Microscopie du Canada, and the International Metallographic Society. An excellent program with an outstanding list of invited speakers for symposia has been assembled by the Program Committee consisting of the Chair, Edgar Voelkl, and Co-Chairs, David Piston (MSA), Raynald Gauvin (MAS/MSC), and Allan Lockley (IMS). Highlights of Microscopy and Microanalysis 2002 include the world's largest display of microscopes and related technologies together with outstanding sessions on all aspects of microscopy and microanalysis. Symposia will be held on 3-D electron microscopy of macromolecules and cryo-electron microscopy of macromolecules, the quantitative aspects of X-ray microscopy, confocal microscopy, biomaterials, biological and materials specimen preparation. Special sessions will be held on holography, phase imaging, deep tissue imaging, (S)TEM instrumentation, developments in focused-ion beam instruments and imaging, metallographic specimen preparation from start to finish, and the changing role of atom probe microscopes in the nanotechnology era. Advances in immunolabeling, EELS, and detectors for X-ray microanalysis also will be presented. A special analytical electron microscopy session honoring the work of Elmar Zeitler is also scheduled. A pre-meetingworkshop “Future of Materials Characterization of Charging Materialsusing Microbeam Analysis” organized by Dr. Raynald Gauvin will be held at McGill University in Montreal on August 2–3. The Local Arrangements Committee, headed by Pierre Charest, has coordinated the scheduling of many local events to complement the meeting.

This book is a compilation of papers presented at the EMAG (Electron Microscopy and Analysis Group of the Institute of Physics) conference held September 5–7, 2001 at the University of Dundee in Scotland. The papers are four pages long, on average, and grouped by subject matter. This book may make a good reference for anyone well-versed in electron microscopy. The paper topics are focused and detailed about a specific material or technique, with some exceptions, and may not be useful as a general reference to the novice. For example, complicated mathematical derivations, high resolution TEM images, and simulated structures are presented in a number of papers without detailed explanation to the less-initiated reader.

The microstructure of Co/Pt multilayers with large perpendicular magnetic anisotropy (PMA) was investigated before and after energetic ion irradiation. No pronounced microstructural changes were detected at ion doses sufficient to completely reduce the PMA and cause a spin reorientation transition to in-plane. Ion-induced displacement of Co and Pt atoms near Co/Pt interfaces lead to local “roughening” and Co layer strain relaxation, reducing the PMA. The magnetic domain confinement induced by ion irradiation and magnetic patterning by selective ion irradiation were also investigated.

The structural and chemical heterogeneity of 2.5-nm Pt50Ru50 electrocatalysts was studied by transmission electron microscopy using selected area diffraction, lattice imaging, electron-energy loss spectroscopy, and energy-dispersive X-ray spectroscopy. The catalysts with the highest methanol oxidation activities exhibit oxidation-induced phase separation on the nanoscale to form Pt-rich metal embedded in Ru-rich hydrous and anhydrous oxide. Reduction of the oxide-on-metal samples produces a true bimetallic face-centered cubic Pt50Ru50 alloy, with 275 times lower oxidation activity.

The Microbeam Analysis Society (MAS) is a nonprofit organization dedicated to the enhancement of microanalysis techniques and instrumentation. The Society, founded in 1968, was originally called the Electron Probe Analysis Society of America. In 1974 the name was changed to the Microbeam Analysis Society to reflect the growing number of micro-analytical techniques of interest to our members. Our members come from industry, academia and government and have a broad range of scientific interests. MAS serves the microanalysis community by providing a forum for education, discussion and exchange of ideas in the field of microanalysis.

It is my great pleasure to welcome you in Quebec City for the Microscopy and Microanalysis 2002 meeting. I invite you to participate in the scientific symposia as well as to attend the exhibits. I also encourage you to visit the old town and the Battlefield Park where you can still hear Wolfe's and Montcalm's weapons used in the dramatic battle of September 1759 that changed the history of North America. I am certain that you will enjoy “Québec Joie de Vivre”.

This paper reviews nanoscale phenomena such as polarization relaxation dynamics and piezoelectric characterization in model ferroelectric thin films and nanostructures using voltage-modulated scanning force microscopy. Using this technique we show the three-dimensional reconstruction of the polarization vector in lead zirconate titanate (PZT) thin films. Second, the time-dependent relaxation of remanent polarization in epitaxial PZT ferroelectric thin films, containing a uniform two-dimensional grid of 90° domains (c-axis in the plane of the film), has been investigated extensively. The 90° domain walls preferentially nucleate the 180° reverse domains during relaxation. Relaxation occurs through the nucleation and growth of reverse 180° domains, which subsequently coalesce and consume the entire region as a function of relaxation time. In addition we also present results on investigation of the relaxation phenomenon on a very local scale, where pinning and bowing of domain walls has been observed. We also show how this technique is used for obtaining quantitative information on piezoelectric constants and by engineering special structures, and how we realize ultrahigh values of piezoconstants. Last, we also show direct hysteresis measurements on nanoscale capacitors, where there is no observable loss of polarization in capacitors as small as 0.16 μm2 in area.

Nanowires of bismuth with diameters ranging from 10 to 200 nm and lengths of 50 μm have been synthesized by a pressure injection method. Nanostructural and chemical compositional studies using environmental and high resolution transmission electron microscopy with electron stimulated energy dispersive X-ray spectroscopy have revealed essentially single crystal nanowires. The high resolution studies have shown that the nanowires contain amorphous Bi-oxide layers of a few nanometers on the surface. In situ environmental high resolution transmission electron microscopy (environmental-HRTEM) studies at the atomic level, in controlled hydrogen and other reducing gas environments at high temperatures demonstrate that gas reduction can be successfully applied to remove the oxide nanolayers and to maintain the dimensional and structural uniformity of the nanowires, which is key to attaining low electrical contact resistance.

As president of IMS, I am pleased to welcome attendees to our 2002 meeting. We have a wonderful site for a great meeting city. Quebec is full of things to see and we have a great Symposium and technical meeting with lots to do and see.

Gold nanoparticles have been synthesized using n-alkylthiol molecules as a passivating agent. By fixing the length of the thiol chain, it is possible to produce nanocrystal arrays, such as 1D chains, 2D arrays of chains, and 3D crystals.

Relationships between volume plasmon excitations and mechanical properties of various materials are considered. Based on systematic evaluation of available data, correlations between the volume plasmon energy, Ep, Young's modulus, Ym, bulk modulus, Bm, shear modulus, Gm, and microhardness, Hm, are established. The resulting correlations indicate that plasmon energies potentially can be used to predict and/or determine the local mechanical properties of technologically important materials, such as metal alloys, semiconductors, and ceramics at the nanometer level.

Convention Center Second Floor

Convention Center Third Floor

Convention Center Fourth Floor

Electron Microscopy by John Bozzola and Lonnie Russell continues to be a text of choice for instruction in classes that cover beginning electron microscopy for biologists and should also be on the bookshelf of all technologists that work with biological specimens for transmission or scanning EM. The first chapter in the book presents a brief, but interesting, history of the development of instrumentation and techniques for specimen preparation and sets the stage for the wealth of practical information that is presented in the remaining twenty chapters. These chapters are laid out in a logical chronological fashion of exactly what one must do to start with an unfixed specimen and end with a publication quality micrograph.

Monday, August 5, 2002: Platform Sessions (AM)

Monday, August 5, 2002: Poster Presentations, 1:00–3:00PM, Exhibit Hall

Monday, August 5, 2002: Platform Sessions (PM)

Monday, August 5, 2002: Presidential Happenings 5:00PM

Tuesday, August 6, 2002: Platform Sessions (AM)

Tuesday, August 6, 2002: Poster Presentations, 1:00–3:00PM, Exhibit Hall

Tuesday, August 6, 2002: Platform Sessions (PM)

Tuesday, August 6, 2002: Presidential Happenings 5:00PM

Wednesday, August 7, 2002: Platform Sessions (AM)

Wednesday, August 7, 2002: Poster Presentations, 1:00–3:00PM, Exhibit Hall

Wednesday, August 7, 2002: Platform Sessions (PM)

Thursday, August 8, 2002: Platform Sessions (AM)

Thursday, August 8, 2002: Platform Sessions (PM)

Monday, August 5, 2002: Platform Sessions (AM)

Monday, August 5, 2002: Poster Presentations, 1:00–3:00PM, Exhibit Hall

Monday, August 5, 2002: Platform Sessions (PM)

Monday, August 5, 2002: Presidential Happenings 5:00PM

Tuesday, August 6, 2002: Platform Sessions (AM)

Tuesday, August 6, 2002: Poster Presentations, 1:00–3:00PM, Exhibit Hall

Tuesday, August 6, 2002: Platform Sessions (PM)

Tuesday, August 6, 2002: Presidential Happenings 5:00PM

Wednesday, August 7, 2002: Platform Sessions (AM)

Wednesday, August 7, 2002: Poster Presentations, 1:00–3:00PM, Exhibit Hall

Wednesday, August 7, 2002: Platform Sessions (PM)

Thursday, August 8, 2002: Platform Sessions (AM)

Thursday, August 8, 2002: Platform Sessions (PM)