Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001
Characterization of Catalysts (Organized by S. Bradley)
Energy-Filtered Imaging of Colloidal Cobalt Metal Particles
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- 02 July 2020, pp. 1090-1091
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Direct Observation of Changes of the Metal-Substrate Interface Chemistry in Supported Heterogeneous Catalysts
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- 02 July 2020, pp. 1092-1093
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Characterization of Antimony-Doped TIN Oxide Catalysts
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- 02 July 2020, pp. 1094-1095
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Structure Changes in Transition Metal Oxides Induced During Electron Microscopy
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- 02 July 2020, pp. 1096-1097
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Characterizing Industrial Catalysts: Challenges and Opportunities
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- 02 July 2020, pp. 1098-1099
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High Resolution TEM Studies On Palladium, Rhodium Nanoparticles
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- 02 July 2020, pp. 1100-1101
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Structural Insights of Supported Nanoparticles By Z-Contrast and High Resolution Electron Microscopy
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- 02 July 2020, pp. 1102-1103
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High Angle Annular Dark Field (HAADF) STEM Tomography of Nanostructured Catalysts
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- 02 July 2020, pp. 1104-1105
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Important Issues on Crystal Size Measurement of Catalysts
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- 02 July 2020, pp. 1106-1107
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Nanoscale Imaging of Topotactic Redox Reactions of Antimony Single Crystals
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- 02 July 2020, pp. 1108-1109
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Surface Structures of Catalytic Oxides
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- 02 July 2020, pp. 1110-1111
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Nanoscale Structural and Chemical Segregation in Pt50Ru50 Electrocatalysts
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- 02 July 2020, pp. 1112-1113
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High-Resolution Backscattered Electron Microscopy: Determining the 3-D Distribution of Metallic Nanoparticles in Supported Catalysts
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- 02 July 2020, pp. 1114-1115
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Knowledge Discovery in Automotive Catalysts Using Microstructural Characterizations
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- 02 July 2020, pp. 1116-1117
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Advanced Composites
Scanning Electron Microscopic Analysis on the Deformation Mechanisms in NACRE
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- 02 July 2020, pp. 1118-1119
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TEM Studies of Shear Bands in a Bulk Metallic Glass Based Composite
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- 02 July 2020, pp. 1120-1121
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Scanning Electron Microscopy Investigation of Deformation in the Vicinity of a Mode II Crack Tip in Unidirectional Toughened Epoxy Composites
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- 02 July 2020, pp. 1122-1123
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Microstructures in Pressureless Sintered AIN-SiC Ceramics
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- 02 July 2020, pp. 1124-1125
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EELS Microanalysis At High Sensitivity: Advances in Spectrum Imaging, Energy Filtering and Detection (Organized by R. Leapman and J. Bruley)
Applications of the SESAM in Materials Science
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- 02 July 2020, pp. 1126-1127
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The New EF-TEM with OMEGA and FEG
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- 02 July 2020, pp. 1128-1129
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