Microscopy and Microanalysis: Volume 10 - Issue S02

< Back to all issues

Volume 10 - Issue S02 - August 2004

Contents

Page 16 of 40

Ceramics & Electronic Materials

Research Article

In-situ Study of Self-assembled Three Dimensional Voids Superlattice in Electron Irradiated CaF2
Tianhua H Ding, Sha Zhu, Kai Sun, Lumin M Wang, Rodney C. Ewing
Published online by Cambridge University Press:

01 August 2004, pp. 588-589
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanoporosity in Aluminosilicate, Geopolymeric Cements
Jonathan L Bell, Waltraud M Kriven
Published online by Cambridge University Press:

01 August 2004, pp. 590-591
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Effects of Rapid Cooling on the Structure and Morphology of Silicon Nanoparticles
Christopher R Perrey, Julia M Deneen, C. Barry Carter
Published online by Cambridge University Press:

01 August 2004, pp. 592-593
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Elemental Mapping of Reaction Ball Milled Y-Ni-O Nanostructures
J Bentley, D T Hoelzer, L Chaffron, D W Coffey, K A Yarborough
Published online by Cambridge University Press:

01 August 2004, pp. 594-595
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Structure Versus Radiation Damage Response in LaXSr(1-3X/2)TiO3 Perovskites
Mark G Blackford, Katherine L Smith, Michael Colella, Chris J Howard, Zhaoming Zhang, Gregory R Lumpkin, Nestor J Zaluzec
Published online by Cambridge University Press:

01 August 2004, pp. 596-597
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM Analysis of an Actinide-Bearing Sorbent: Monosodium Titanate
N.L. Dietz, M.C. Duff, D.T. Hobbs, D.B. Hunter
Published online by Cambridge University Press:

01 August 2004, pp. 598-599
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization and Performance of Advanced Coatings and Thin Films

Research Article

Optimizing Hardness and Residual Stress in Sputtered TiN Coatings
Surendra Gupta, David Glocker, Mark Romach
Published online by Cambridge University Press:

01 August 2004, pp. 600-601
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanoindentation and X-ray Diffraction Study of Sputtered TiCN Coatings
Surendra Gupta, David Glocker, Mark Romach
Published online by Cambridge University Press:

01 August 2004, pp. 602-603
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Microstructural Characterization of Transparent Conducting Film CdO on MgO (100) by TEM
Jian-Guo Zheng, Andrew Metz, Vinayak P Dravid, Tobin Marks
Published online by Cambridge University Press:

01 August 2004, pp. 604-605
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Spatially-resolved EELS and EDS Analysis of HfOxNy Gate Dielectrics Deposited by MOCVD using [(C2H5)2N]4Hf with NO and O2
X Wu, M. Couillard, M.-S. Lee, J.-H. Chen, G.A. Botton, D. Landheer, Z.-H. Lu, W.-T. Ng, T.-S. Chao
Published online by Cambridge University Press:

01 August 2004, pp. 606-607
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cathodoluminescence Imaging and Spectroscopy of Tellurium Doped Group IIA Sulfide Thin Films for Solid State Ultraviolet Emitters
Robert Lee, Jeff Hoekstra, James M Fitz-Gerald, Jason D Fowlkes, Philip D Rack
Published online by Cambridge University Press:

01 August 2004, pp. 608-609
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization and Application of Semiconductor Thin Films Deposited by Chemical Bath Deposition
Chih-hung Chang, Yu-Jen Chang, Doo-Hyoung Lee, Si-Ok Ryu, Tae-Jin Lee
Published online by Cambridge University Press:

01 August 2004, pp. 610-611
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of Boron Segregation in CoCrPtB Longitudinal Magnetic Recording Media
James Wittig, James Bentley, Neal D Evans
Published online by Cambridge University Press:

01 August 2004, pp. 612-613
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Mechanisms for the Behaviour of Amorphous Carbon Films During Annealing
D.G. McCulloch, J.L. Peng, D.R. McKenzie, S.P. Lau, D. Sheeja, B.K. Tay
Published online by Cambridge University Press:

01 August 2004, pp. 614-615
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Microstructural Evaluation of Degradation Mechanisms in Thermally Treated TaSiN Diffusion Barriers for Cu Interconnects
Hans-Juergen Engelmann, RenË Huebner, Michael Hecker, Norbert Mattern, Christian Wenzel, Ehrenfried Zschech, Klaus Wetzig
Published online by Cambridge University Press:

01 August 2004, pp. 616-617
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of Coatings for Hydrogen Permeation Resistance
Paul Korinko
Published online by Cambridge University Press:

01 August 2004, pp. 618-619
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fabrication And Characterization Of Diffusion Barriers For CuSiC Metal Matrix Composites: The Thermal Management Materials for Next Generation Power Electronics
Pradeep Paul, Changmo Sung, Glenn Sundberg
Published online by Cambridge University Press:

01 August 2004, pp. 620-621
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of an Oxidized Heat Shield
Paul Korinko
Published online by Cambridge University Press:

01 August 2004, pp. 622-623
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Organic Surface Monolayer Imaging and Quantification in Mineral Systems: A Multitechnique Approach
G.C. Van Leerdam, F.A. Buijtenhuijs, J.W.G. Mahy
Published online by Cambridge University Press:

01 August 2004, pp. 624-625
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Surface Structural Characterization of Antiblock Films Containing Erucamide
John Catino, John Gardiner
Published online by Cambridge University Press:

01 August 2004, pp. 626-627
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 16 of 40

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 10 - Issue S02 - August 2004

Ceramics & Electronic Materials

Research Article

In-situ Study of Self-assembled Three Dimensional Voids Superlattice in Electron Irradiated CaF2

Nanoporosity in Aluminosilicate, Geopolymeric Cements

The Effects of Rapid Cooling on the Structure and Morphology of Silicon Nanoparticles

Elemental Mapping of Reaction Ball Milled Y-Ni-O Nanostructures

Structure Versus Radiation Damage Response in LaXSr(1-3X/2)TiO3 Perovskites

TEM Analysis of an Actinide-Bearing Sorbent: Monosodium Titanate

Characterization and Performance of Advanced Coatings and Thin Films

Research Article

Optimizing Hardness and Residual Stress in Sputtered TiN Coatings

Nanoindentation and X-ray Diffraction Study of Sputtered TiCN Coatings

Microstructural Characterization of Transparent Conducting Film CdO on MgO (100) by TEM

Spatially-resolved EELS and EDS Analysis of HfOxNy Gate Dielectrics Deposited by MOCVD using [(C2H5)2N]4Hf with NO and O2

Cathodoluminescence Imaging and Spectroscopy of Tellurium Doped Group IIA Sulfide Thin Films for Solid State Ultraviolet Emitters

Characterization and Application of Semiconductor Thin Films Deposited by Chemical Bath Deposition

Characterization of Boron Segregation in CoCrPtB Longitudinal Magnetic Recording Media

Mechanisms for the Behaviour of Amorphous Carbon Films During Annealing

Microstructural Evaluation of Degradation Mechanisms in Thermally Treated TaSiN Diffusion Barriers for Cu Interconnects

Characterization of Coatings for Hydrogen Permeation Resistance

Fabrication And Characterization Of Diffusion Barriers For CuSiC Metal Matrix Composites: The Thermal Management Materials for Next Generation Power Electronics

Characterization of an Oxidized Heat Shield

Organic Surface Monolayer Imaging and Quantification in Mineral Systems: A Multitechnique Approach

Surface Structural Characterization of Antiblock Films Containing Erucamide

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 10 - Issue S02 - August 2004

Ceramics & Electronic Materials

Research Article

Characterization and Performance of Advanced Coatings and Thin Films

Research Article