Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 10 of 41

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials

Research Article

ELNES of Al-Al4C3 Nanoparticles Produced By Mechanical Milling
A Santos-Beltrán, S Maldonado-Ruiz, R Martínez-Sánchez, F Espinosa-Magaña, H Flores, V Gallegos-Orozco
Published online by Cambridge University Press:

03 August 2008, pp. 362-363
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Selective Dealloying with Supercritical Carbon Dioxide
K Dorame, R Morrish, A Muscat
Published online by Cambridge University Press:

03 August 2008, pp. 364-365
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Pt Nanoparticles by EELS and ab initio calculations
Y Gochi-Ponce, V Gallegos-Orozco, A Santos-Beltran, R Martinez-Sanchez, F Espinosa-Magaña
Published online by Cambridge University Press:

03 August 2008, pp. 366-367
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microstructural Characterization of Aluminum - Silver Nanoparticles Composites Produced by Mechanical Milling
DC Mendoza-Ruiz, I Estrada-Guel, W Antúnez-Flores, R Martinez-Sánchez
Published online by Cambridge University Press:

03 August 2008, pp. 368-369
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Phase Separation and Crystallization of Magnetic Nanoparticles in a Borosilicate Glass
MA Laurenzi III, IL Pegg
Published online by Cambridge University Press:

03 August 2008, pp. 370-371
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

XAS and grazing angle XRD of the CoTi2 thin films grown by DC co-sputtering technique
I Yocupicio-Villegas, H Esparza-Ponce, JA Duarte-Moller
Published online by Cambridge University Press:

03 August 2008, pp. 372-373
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Complementary Microscopy Techniques for Characterizing Nanostructures
J Basu, R Divakar, N Ravishankar, CB Carter
Published online by Cambridge University Press:

03 August 2008, pp. 374-375
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Coupling LEAP and HRSTEM to study the nanoscale structure and chemistry of interfaces
R Srinivasan, A Genc, R Banerjee, JY Hwang, J Tiley, GB Viswanathan, HL Fraser
Published online by Cambridge University Press:

03 August 2008, pp. 376-377
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Special Topic Session: EM Preparation Revisited - Dealing with the Nanoworld

Research Article

Nanotech drives imaging toward faster, sleeker, more economic
B Foster
Published online by Cambridge University Press:

03 August 2008, pp. 378-379
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in TEM Sample Preparation Using a Focused Ion Beam
B Van Leer, LA Giannuzzi
Published online by Cambridge University Press:

03 August 2008, pp. 380-381
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Sample Preparation Considerations for Electron Microscopy Characterization of Nano-Materials
SD Walck
Published online by Cambridge University Press:

03 August 2008, pp. 382-383
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Challenging Analysis for the Gate Stack and Strained Channel of the Advanced CMOS
G Lian, C Vartuli, J Chung
Published online by Cambridge University Press:

03 August 2008, pp. 384-385
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantitative Strain Measurement in Sub-45 nm CMOS Transistors by Convergent Beam Electron Diffraction (CBED) at Low Temperature and Nano Beam Diffraction (NBD)
L Clement, D Delille
Published online by Cambridge University Press:

03 August 2008, pp. 386-387
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Local Strain Measurement by Geometrical Phase Analysis in the Transmission Electron Microscope Applied to Strain-Engineered CMOS Devices
J Chung, G Lian, C Vartuli, S Rajagopalan, L Rabenberg
Published online by Cambridge University Press:

03 August 2008, pp. 388-389
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EFTEM- and STEM-EDXS Spectral Imaging of "Hidden" Si-based Semiconductor Device Defects
CT Schamp, BT Valdez
Published online by Cambridge University Press:

03 August 2008, pp. 390-391
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EBIC Targeting for Dual Beam FIB Based TEM Sample Preparation
N Presser, B Foran, Y Sin, M Mason, SC Moss
Published online by Cambridge University Press:

03 August 2008, pp. 392-393
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Tunneling Magnetoresistance and B Diffusion in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions Characterized by STEM-EELS
JJ Cha, JC Read, RA Buhrman, DA Muller
Published online by Cambridge University Press:

03 August 2008, pp. 394-395
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Structural Analysis for Luminous Defects on GaN Epitaxial Layers
P Yongchoon, K Miyang, K Bae-Kyun
Published online by Cambridge University Press:

03 August 2008, pp. 396-397
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-situ probing the electrical, mechanical, and thermal properties of individual carbon nanotubes and nanowires by using a TEM-SPM platform
J-Y Huang
Published online by Cambridge University Press:

03 August 2008, pp. 398-399
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-Situ Characterization of 2D Potential Distributions in Biased Si n+-p Junctions Using Off-Axis Electron Holography
M Han, T Hirayama, DJ Smith, MR McCartney
Published online by Cambridge University Press:

03 August 2008, pp. 400-401
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 10 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials

Research Article

ELNES of Al-Al4C3 Nanoparticles Produced By Mechanical Milling

Selective Dealloying with Supercritical Carbon Dioxide

Pt Nanoparticles by EELS and ab initio calculations

Microstructural Characterization of Aluminum - Silver Nanoparticles Composites Produced by Mechanical Milling

Phase Separation and Crystallization of Magnetic Nanoparticles in a Borosilicate Glass

XAS and grazing angle XRD of the CoTi2 thin films grown by DC co-sputtering technique

Complementary Microscopy Techniques for Characterizing Nanostructures

Coupling LEAP and HRSTEM to study the nanoscale structure and chemistry of interfaces

Special Topic Session: EM Preparation Revisited - Dealing with the Nanoworld

Research Article

Nanotech drives imaging toward faster, sleeker, more economic

Advances in TEM Sample Preparation Using a Focused Ion Beam

Sample Preparation Considerations for Electron Microscopy Characterization of Nano-Materials

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Challenging Analysis for the Gate Stack and Strained Channel of the Advanced CMOS

Quantitative Strain Measurement in Sub-45 nm CMOS Transistors by Convergent Beam Electron Diffraction (CBED) at Low Temperature and Nano Beam Diffraction (NBD)

Local Strain Measurement by Geometrical Phase Analysis in the Transmission Electron Microscope Applied to Strain-Engineered CMOS Devices

EFTEM- and STEM-EDXS Spectral Imaging of "Hidden" Si-based Semiconductor Device Defects

EBIC Targeting for Dual Beam FIB Based TEM Sample Preparation

Tunneling Magnetoresistance and B Diffusion in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions Characterized by STEM-EELS

Structural Analysis for Luminous Defects on GaN Epitaxial Layers

In-situ probing the electrical, mechanical, and thermal properties of individual carbon nanotubes and nanowires by using a TEM-SPM platform

In-Situ Characterization of 2D Potential Distributions in Biased Si n+-p Junctions Using Off-Axis Electron Holography

Microscopy and Microanalysis

Refine listing

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Volume 14 - Supplement S2 - August 2008

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials

Research Article

Special Topic Session: EM Preparation Revisited - Dealing with the Nanoworld

Research Article

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article