Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

Electron Backscattered Diffraction and Transmission Electron Microscopy Analysis of Ribbon Silicon
S. Rouvimov, E. Tsidilkovski, J.J. Donovan
Published online by Cambridge University Press:

23 November 2012, pp. 1442-1443
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of Silver Nanowires by Scanning Electron Microscopy and Image Analysis
P. Eastman, G. Khanarian, X. Liu, D. Werner, G. Athens, A. Malek
Published online by Cambridge University Press:

23 November 2012, pp. 1444-1445
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

HRTEM Characterization of Nanoparticles Dispersed into Aluminum Nanocomposites Produced by Mechanical Milling
A. Santos Beltran, R. Martinez Sanchez, R. Goytia Reyes, V. Gallegos
Published online by Cambridge University Press:

23 November 2012, pp. 1446-1447
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM
J. Cantu Valle, A. Ponce, M. Jose-Yacaman, R. Droopad, R. Contreras-Guerrero
Published online by Cambridge University Press:

23 November 2012, pp. 1448-1449
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Electron Backscatter Diffraction Characterization of Nanostructured Thermoelectric Materials
M. Nowell, J. Beck, M. Alvarado, D. Nemir
Published online by Cambridge University Press:

23 November 2012, pp. 1450-1451
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Determining the chemical elements present in soybean leaves infected with Asian Soybean Rust employing X-ray fluorescence by SEM
P.A. Aragao, C. Andrade, J.C. Spadotto, A.N. Rodrigues
Published online by Cambridge University Press:

23 November 2012, pp. 1452-1453
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

TEM Analyses of Bismuth-Antimony Thermoelectric Nanowires
M.A. Hekmaty, J.L. Lensch-Falk, D.L. Medlin, W.G. Yelton, S.J. Limmer, M.P. Siegal
Published online by Cambridge University Press:

23 November 2012, pp. 1454-1455
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Scanning Transmission Electron Microscopy Evidences Of Interstitial And Substitutional Oxygen In MBE Grown Fe1+xTe Thin Films And Emergence Of Superconductivity
H. Hu, M. Zheng, J.N. Eckstein, J. Zuo
Published online by Cambridge University Press:

23 November 2012, pp. 1456-1457
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Local short- and medium-range order in amorphous transparent oxide thin films
A. Yan, B. Buchholz, R. Chang, V. Dravid, K.B. Borisenko, A. Kirkland, T. Sun
Published online by Cambridge University Press:

23 November 2012, pp. 1458-1459
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

High-Resolution Near-Edge Structures in EuTiO3, SrTiO3 and BaTiO3
M. Bugnet, D. Rossouw, G.A. Botton, T. Kolodiazhnyi
Published online by Cambridge University Press:

23 November 2012, pp. 1460-1461
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films
M. Jablonski, C.R. Winkler, M.L. Taheri, A.R. Damodaran, J. Karthik, J.G. Wen, D.J. Miller
Published online by Cambridge University Press:

23 November 2012, pp. 1462-1463
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Structural Investigation of Fe-doped SmCo4B Alloy System by TEM
X. Li, B. Das, B. Balamurugan, V.R. Shah, R. Skomski, D.J. Sellmyer, E.S. Krage, Y. Huh
Published online by Cambridge University Press:

23 November 2012, pp. 1464-1465
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Atomic Resolution Quantification of Chemical Ordering in a Layered Perovskite
M.A. Roldan, M. Varela, S.J. Pennycook, M. Oxley, K. Gray, J. Mitchell, H. Zheng, Q. Li
Published online by Cambridge University Press:

23 November 2012, pp. 1466-1467
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

HREM of Porous Prussian Blue Type Materials for Hydrogen Storage
H.A. Calderon, R. Edilso
Published online by Cambridge University Press:

23 November 2012, pp. 1468-1469
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Structural Characterization of Cu2S Nanowires on Polyacrylonitrile Nanofibers by TEM
X. Li, A.V. Goponenko, Y. Dzenis, Z. Li, C. Wang
Published online by Cambridge University Press:

23 November 2012, pp. 1470-1471
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Hierarchically Structured Precipitates in a Ferritic Alloy Characterized by Diffraction Contrast and Energy Filtered Imaging
C. Liebscher, M. Asta, V. Radmilovic, U. Dahmen, G. Gosh
Published online by Cambridge University Press:

23 November 2012, pp. 1472-1473
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In- situ Analysis of Charge Ordering in Perovskite Heterostructures at Various Temperatures
J.D. Sloppy, M.L. Jablonski, R. Sichel-Tissot, J. Donius, S. May, M.L. Taheri
Published online by Cambridge University Press:

23 November 2012, pp. 1474-1475
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Synthesis of New Electrode Materials for Li-Ions Batteries using an Environmental HRTEM.
M.L. Trudeau, V. René, Z. Karim
Published online by Cambridge University Press:

23 November 2012, pp. 1476-1477
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-Situ Heating Studies of Flux Grown Barium Titanate Thin Films
M.J. Burch, D. Harris, R.M. White, A. Moballegh, J. Li, J. Maria, E.C. Dickey
Published online by Cambridge University Press:

23 November 2012, pp. 1478-1479
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

The sources of contamination of TEM samples and the means for its reduction
C. Soong, D. Hoyle, M. Malac, R. Egerton
Published online by Cambridge University Press:

23 November 2012, pp. 1480-1481
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Physical Science Symposium

Electron Microscopy/Spectroscopy of Energy-Related Materials-12

Research Article

Electron Backscattered Diffraction and Transmission Electron Microscopy Analysis of Ribbon Silicon

Characterization of Silver Nanowires by Scanning Electron Microscopy and Image Analysis

HRTEM Characterization of Nanoparticles Dispersed into Aluminum Nanocomposites Produced by Mechanical Milling

Electron Microscopy/Spectroscopy of Energy-Related Materials-13

Research Article

Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM

Electron Backscatter Diffraction Characterization of Nanostructured Thermoelectric Materials

Determining the chemical elements present in soybean leaves infected with Asian Soybean Rust employing X-ray fluorescence by SEM

TEM Analyses of Bismuth-Antimony Thermoelectric Nanowires

Scanning Transmission Electron Microscopy Evidences Of Interstitial And Substitutional Oxygen In MBE Grown Fe1+xTe Thin Films And Emergence Of Superconductivity

Local short- and medium-range order in amorphous transparent oxide thin films

High-Resolution Near-Edge Structures in EuTiO3, SrTiO3 and BaTiO3

In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films

Structural Investigation of Fe-doped SmCo4B Alloy System by TEM

Atomic Resolution Quantification of Chemical Ordering in a Layered Perovskite

HREM of Porous Prussian Blue Type Materials for Hydrogen Storage

Structural Characterization of Cu2S Nanowires on Polyacrylonitrile Nanofibers by TEM

Hierarchically Structured Precipitates in a Ferritic Alloy Characterized by Diffraction Contrast and Energy Filtered Imaging

In- situ Analysis of Charge Ordering in Perovskite Heterostructures at Various Temperatures

Electron Microscopy/Spectroscopy of Energy-Related Materials-14

Research Article

Synthesis of New Electrode Materials for Li-Ions Batteries using an Environmental HRTEM.

In-Situ Heating Studies of Flux Grown Barium Titanate Thin Films

The sources of contamination of TEM samples and the means for its reduction

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Physical Science Symposium

Electron Microscopy/Spectroscopy of Energy-Related Materials-12

Research Article

Electron Microscopy/Spectroscopy of Energy-Related Materials-13

Research Article

Electron Microscopy/Spectroscopy of Energy-Related Materials-14

Research Article