Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

ColorSEM: Livetime Quantitative X-ray Mapping in an Integrated EDS Workflow

High Resolution Low kV SEM EDS – Breaking Convention with Low Working Distance EDS

Standard-less Quantification and Standard Customized Coefficients

Probelab ReImager: Open Source Software for Streamlining Image Processing

Bremsstrahlung Background Modeling Without Fit Regions

EPMA Characterization of Gold Associated with Different Sulfide Textures at the Monument Bay Deposit, Manitoba, Canada

EDS Analysis of Icosahedral Quasicrystalline Thin Film in Al65Cu25Fe15 Alloy Prepared by Arc-melting

Definition of the Detection Limit in Energy-dispersive Spectrometry

Characterization of KNb3O8 Powders by Raman Spectroscopy and Scanning Electron Microscopy

The Effect of Deadtime and Pulse Processing Time Constant on Standards-based Quantitative EDS Microanalysis

SrTiO3 Surface Post Photocatalytic Water Oxidation: TEM Chemical and Structural Analyses

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

Electrochemical Study of Metallic Foams Ti-Ta-Sn Through SEM

Elemental Morphological and Chemical Characterization of Individual TSP Particles by SEM-EDS

Mill Processing in Three Different Devices; The Effect of Intrinsic Intensity on the Material

Microanalysis of the Cross-sectional Surface of 3D Printed NiMnGa Magnetic Shape Memory Alloy Using Electron Microscopy and Nanoindentation

Study of Microstructure and Hardness in A356 Aluminum Alloy Reinforced with Al2O3 and WC After Hot Extrusion.

A Microstructure Comparison of TiN with a Cr Metallic Interlayer and Boride Layers Formed on AISI 304 Steel: Wear Properties

Recycling of the Powder-pack Boriding Mixture: Microstructural Characterization of Fe2B Layers on ASTM A36 Steel

SEM & STEM Multi-scale Characterization of Fatigue Damage in CrCoNi Medium-entropy Alloy with Fully Recrystallized Microstructure

Plasma FIB Spin Milling Accelerates Battery Research

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens