Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

In-situ TEM Observation of NixAsy Nanosheet Formation by Inter-diffusion of Ni into Black As

New Frontiers in Electron Microscopy of Two-dimensional Materials

Imaging of 2-Dimensional Dislocation Networks in Twisted Bilayer Graphene and Beyond

Twist and Bend in Van Der Waals Materials and 2D Stacked Heterostructures

Forbidden Reflection Moiré Patterns in Metal-2D Material Interfaces

Torsional Periodic Lattice Distortion in Twisted Bilayer Graphene

Advanced Characterization of Nuclear Fuels and Materials

Rapid Characterization Methods for Accelerated Innovation for Nuclear Fuel Cladding

In-situ High Temperature Ion Irradiation Transmission Electron Microscopy to Understand Fission Product Transport in Silicon Carbide of TRISO Fuel

3D X-ray Microscopy of Nuclear Energy Materials

Comparison of Two Irradiated Metallic Fuels by Electron Probe Micro-analysis

In situ TEM at the Extremes - Radiation Damage

Exploring Coupled Extreme Environments via In-situ Transmission Electron Microscopy

Stainless Steel 304 Micro-pillar Mechanical Response to Ion Irradiation and Helium Implantation Under Transmission Electron Microscopy Observation

In Situ TEM Investigation of Irradiation Induced Amorphization of Fe Oxide

In-situ Observation of Irradiation Induced Defects in Fe and Fe-Cr Alloys

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Slice and View SEM Tomography of 3D Periodic Block CoPolymer Tubular Morpholgies

FIB-SEM Tomography and Its Application Towards Understanding Aerosol Optical Properties of Atmospheric Dust Particles

Increasing the Stability and Quality of High-resolution FIB-SEM Tomography

Improvements in Low Voltage PFIB for Sample Preparation and Large Volume Serial Sectioning Tomography

Characterization of Oxide/Sulfide Molybdenum Hexagonal Rods

Approaching Operando Imaging of Functional Materials

Investigating the Behavior of Cu-based Catalysts During Electrochemical CO2 Reduction with Liquid Cell Electron Microscopy

Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

New Frontiers in Electron Microscopy of Two-dimensional Materials

Advanced Characterization of Nuclear Fuels and Materials

In situ TEM at the Extremes - Radiation Damage

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Approaching Operando Imaging of Functional Materials