Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

Direct Imaging of Electron Transfer and Its Influence on Superconducting Pairing at FeSe/SrTiO3 Interface

Atomic-resolution study of oxygen vacancy ordering in Lao.5Sro.5CoO3-s thin films on SrTiO3 during in situ cooling experiments.

Atomic-resolution Cryo-STEM Imaging of a Structural Phase Transition in TaTe2

Dislocation-Driven Growth of Two-Dimensional Lateral Quantum Well Superlattices

Direct Imaging of Low-Dimensional Nanostructures

Towards the Mechanism of Oxygen Vacancy Formation & Ordering via Tracking of Beam-Induced Dynamics and Density Functional Theory

Reversible Structure Manipulation by Tuning Electron Dose Rate on Metastable CU2S

Leveraging Single Atom Dynamics to Measure the Electron-Beam-Induced Force and Atomic Potentials

Temperature Measurement by a Nanoscale Electron Probe using Energy Gain and Loss Spectroscopy

Atomic-Scale Identification of Planar Defects in Cesium Lead Bromide Perovskite Nanocrystals

Atomic-Resolution Study of Grain Boundaries in CdTe Using Scanning Transmission Electron Microscopy

Defect-assisted Reorganization of Ferroelectric Domain Walls Revealed by Aberration-corrected Electron Microscopy

Real-Space Study of Charge and Orbital Ordering in Lao.6Sr2.4Mn2O7 Manganite Single Crystal

Towards Quantitative Atomic-Scale Imaging of Magnetization Distributions in Materials Using Aberration-Corrected Off-Axis Electron Holography

Linear and Nonlinear Reconstruction Algorithms for Atomic-Resolution Tomography Using Phase Contrast Electron Microscopy

Deep Convolutional Neural Networks for Symmetry Detection

Atomic-resolution electric field measurements with a universal detector

Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.

Surface and Electric Field Imaging by Newly Designed Atomic-Resolution STEM

Resolution Achievement of 40.5 pm in Scanning Transmission Electron Microscopy using 300 kV Microscope with Delta Corrector

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract