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Zr-doped Al2O3 Grain Boundary and Interfacial Microstructure

Published online by Cambridge University Press:  04 August 2017

Zhenyu Liu*
Affiliation:
Thin Film Technology, Kennametal Inc, 1600 Technology Way, Latrobe, PA 15650, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

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[6] The authors acknowledge Mr. Tom Nuhfer at Department of Materials Science, Carnegie Mellon University for the help on the TEM observation.Google Scholar