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X-Ray Microcomputed Tomography for Analysis of Retrieved Medical Devices

Published online by Cambridge University Press:  23 September 2015

Judd S Day ,
Daniel W Macdonald  and
Steven M Kurtz
Judd S Day
Affiliation:
Exponent, Inc., Philadelphia, PA, USA. Implant Research Center, Drexel University, Philadelphia, PA, USA.
Daniel W Macdonald
Affiliation:
Implant Research Center, Drexel University, Philadelphia, PA, USA.
Steven M Kurtz
Affiliation:
Exponent, Inc., Philadelphia, PA, USA. Implant Research Center, Drexel University, Philadelphia, PA, USA.

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 449 - 450
Copyright
Copyright © Microscopy Society of America 2015