No CrossRef data available.
Article contents
XPS Spectromicroscopy as an Optimised Technique for Materials Characterisation.
Published online by Cambridge University Press: 25 July 2016
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927616002750/resource/name/firstPage-S1431927616002750a.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 380 - 381
- Copyright
- © Microscopy Society of America 2016
References
References:
[1]
Smith, E.F., Briggs, D. & Fairley, N.
Surf. Interface Anal.
(2005)
38, 69–75.CrossRefGoogle Scholar
[3]
Barlow, A.J., Scott, O., Sano, N. & Cumpson, P.J.
Surf. Interface Anal.
(2015)
47, 173–175.CrossRefGoogle Scholar