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Vibrational STEM-EELS of Single Si Atom Point Defects in Graphene

Published online by Cambridge University Press:  30 July 2020

Fredrik Hage ,
Guillaume Radtke ,
Demie Kepaptsoglou ,
Michele Lazzeri  and
Quentin Ramasse
Fredrik Hage
Affiliation:
SuperSTEM Laboratory and University of Oxford, Daresbury, England, United Kingdom
Guillaume Radtke
Affiliation:
Sorbonne Université - CNRS, Paris, Ile-de-France, France
Demie Kepaptsoglou
Affiliation:
SuperSTEM Laboratory and University of York, Daresbury, England, United Kingdom
Michele Lazzeri
Affiliation:
Sorbonne Université - CNRS, Paris, Ile-de-France, France
Quentin Ramasse
Affiliation:
SuperSTEM Laboratory and University of Leeds, Daresbury, England, United Kingdom

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 954 - 955
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Copyright
Copyright © Microscopy Society of America 2020

References

Krivanek, OL, Lovejoy, TC, Dellby, N et al. , Nature 514 (2014 ), p. 209.10.1038/nature13870CrossRefGoogle Scholar
Lagos, MJ, Trügler, A, Hohenester, U, Batson, PE, Nature 543 (2017), p. 529.10.1038/nature21699CrossRefGoogle Scholar
Hachtel, JA, Huang, J, Popovs, I et al. , Science 363 (2019), p. 525.10.1126/science.aav5845CrossRefGoogle Scholar
Hage, FS, Nicholls, RJ, Yates, JR, et al., Sci. Adv. 4 (2018), eaar7495.10.1126/sciadv.aar7495CrossRefGoogle Scholar
Nicholls, RJ, Hage, FS, McCulloch, DG, et al., Phys. Rev. B. 99 (2019), 094105.10.1103/PhysRevB.99.094105CrossRefGoogle Scholar
Senga, R, Suenaga, K, Barone, P et al. , Nature 573 (2019), p. 247.10.1038/s41586-019-1477-8CrossRefGoogle Scholar
Hage, FS, Kepaptsoglou, DM, Ramasse, QM, Allen, LJ, Phys. Rev. Lett. 122 (2019), 016103.10.1103/PhysRevLett.122.016103CrossRefGoogle Scholar
Hage, FS, Radtke, G, Kepaptsoglou, DM, Lazzeri, M, Ramasse, QM, accepted in Science.Google Scholar
Ramasse, QM, Seabourne, CR, Kepaptsoglou, DM, et al. , Nano Lett. 13 (2013), p. 4989.10.1021/nl304187eCrossRefGoogle Scholar
SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar