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Ultra-high Energy Resolution EELS

Published online by Cambridge University Press:  30 July 2020

Niklas Dellby
Affiliation:
Nion Co., Kirkland, Washington, United States
Tracy Lovejoy
Affiliation:
Nion Co., Kirkland, Washington, United States
George Corbin
Affiliation:
Nion Co., Kirkland, Washington, United States
Nils Johnson
Affiliation:
Nion Co., Kirkland, Washington, United States
Russel Hayner
Affiliation:
Nion Co., Kirkland, Washington, United States
Matthew Hoffman
Affiliation:
Nion Co., Kirkland, Washington, United States
Petr Hrncrik
Affiliation:
Nion Co., Kirkland, Washington, United States
Benjamin Plotkin-Swing
Affiliation:
Nion Co., Kirkland, Washington, United States
Dylan Taylor
Affiliation:
Nion Co., Kirkland, Washington, United States
Ondrej Krivanek
Affiliation:
Nion Co., Kirkland, Washington, United States

Abstract

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Type
Vendor Symposium - Imaging
Copyright
Copyright © Microscopy Society of America 2020

References

Krivanek, O.L. et al. ., Nature 514 (2014) 209; T. Miata et al., Microscopy 63 (2014) 37710.1038/nature13870CrossRefGoogle Scholar
Lovejoy, T.C. et al. ., Microsc. Microanal. 24 (Suppl 1, 2018) 446-44710.1017/S1431927618002726CrossRefGoogle Scholar
Hachtel, J. et al. ., Science 363 (2019) 52552810.1126/science.aav5845CrossRefGoogle Scholar
Lagos, MJ and Batson, PE, Nature, 543, 529-532(2017), C. Dwyer et al., Phys. Rev. Lett 117 (2016) 25610110.1038/nature21699CrossRefGoogle Scholar
Hage, F.S. et al. ., Phys. Rev. Lett 122 (2019) 01610310.1103/PhysRevLett.122.016103CrossRefGoogle Scholar
Venkatraman, K. et al. ., Nat. Phys. 15, 1237-1241(2019)10.1038/s41567-019-0675-5CrossRefGoogle Scholar
Lovejoy, T.C. et al. ., Microsc. Microanal. 25 (Suppl 2, 2019) 628-629, and these proceedings 10.1017/S1431927619003878CrossRefGoogle Scholar