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Towards Low-Damage TEM Sample Preparation of Carbonaceous Materials in the Focused Ion Beam

Published online by Cambridge University Press:  26 July 2009

N Bassim ,
B De Gregorio ,
AD Kilcoyne ,
K Scott ,
T Chou ,
S Wirick ,
G Cody ,
PE Fischione ,
J Liu  and
R Stroud
N Bassim
Affiliation:
U S Naval Research Laboratory
B De Gregorio
Affiliation:
U S Naval Research Laboratory
AD Kilcoyne
Affiliation:
Lawrence Berkeley National Laboratory
K Scott
Affiliation:
National Institute of Standards and Technology
T Chou
Affiliation:
FEI Company
S Wirick
Affiliation:
Brookhaven National Laboratory
G Cody
Affiliation:
Carnegie Institute of Washington
PE Fischione
Affiliation:
E A Fischione Instruments
J Liu
Affiliation:
E A Fischione Instruments
R Stroud
Affiliation:
U S Naval Research Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 342 - 343
Copyright
Copyright © Microscopy Society of America 2009