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ToF-SIMS Investigations of Tip-Surface Chemical Interactions in Atomic Force Microscopy on a Combined AFM/ToF-SIMS Platform

Published online by Cambridge University Press:  04 August 2017

Chance C. Brown ,
Anton V. Ievlev ,
Petro Maksymovych ,
Sergei V. Kalinin  and
Olga S. Ovchinnikova
Chance C. Brown
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Bredesen Center for Interdisciplinary Research and Graduate Education, University of Tennessee, Knoxville, TN
Anton V. Ievlev
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Petro Maksymovych
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Olga S. Ovchinnikova
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2082 - 2083
Copyright
© Microscopy Society of America 2017 

References

[1] Binning, G.K Phys. Scr. T19A 1987). p. 53.Google Scholar
[2] Kalinin, S.V., et.al, Rep. Prog Phys 73 2010). p. 056502.Google Scholar
[3] Wang, R.V., et.al, Phys. Rev. Lett 102 2009). p. 047601.Google Scholar
[4] Ievlev, A.V., et.al, ACS Applied Materials & Interfaces 8(43 2016). p. 29588.Google Scholar
[5] Research supported by Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy, Office of Science User Facility.Google Scholar