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TEM Specimen Preparation of Oxidized Ni-Base Alloys using the Focused Ion Beam (FIB) Technique

Published online by Cambridge University Press:  02 July 2020

K.L. More ,
D.W. Coffey ,
B.A. Pint ,
K.S. Trent  and
P.F. Tortorelli
K.L. More
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831-6064
D.W. Coffey
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831-6064
B.A. Pint
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831-6064
K.S. Trent
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831-6064
P.F. Tortorelli
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831-6064
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Extract

Microstructural characterization of thin alumina scales formed on oxidized Ni-base alloys using transmission electron microscopy (TEM) has long been a challenge as a result of the many problems encountered during the preparation of thin specimens. Successful and reproducible preparation of uniformly thin, cross-section TEM specimens from these multicomponent “layered” structures (alumina scale on a metallic substrate) is extremely difficult using standard ion beam thinning procedures for several reasons: (1) differential thinning of the various constituents in the system can occur, (2) a weak ceramic-metal interface may lead to separation during the harsh mechanical grinding and thinning procedure, (3) fully intact scales are rarely achieved since native surface structures are usually lost during ion milling, and (4) extensive damage can be created in the scale and alloy during rough grinding and polishing steps as well as during final ion beam thinning.

Type
Applications and Developments of Focused Ion Beams
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 540 - 541
Copyright
Copyright © Microscopy Society of America

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References

References:

[1]Dravid, V.P., Hitachi Instrument News 34 (1998) 3.Google Scholar
[2]Pint, B.A., et. al., to be published in Proc. of Microscopy of Oxidation 4. (2000).Google Scholar
[3] Research sponsored by the U.S. Dept. of Energy, Office of Energy Eff. and Renewable Energy, Office of Ind. Tech., as part of the ATS Program, under contract No. DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp.Google Scholar