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TEM Specimen Preparation for In Situ Heating Experiments Using FIB

Published online by Cambridge University Press:  04 August 2017

Sriram Vijayan ,
Mark Aindow ,
Joerg R. Jinschek ,
Stephan Kujawa  and
Jens Greiser
Sriram Vijayan
Affiliation:
Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT, USA.
Mark Aindow
Affiliation:
Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT, USA.
Joerg R. Jinschek
Affiliation:
FEI Company, Achtseweg Noord 5, Eindhoven, The Netherlands.
Stephan Kujawa
Affiliation:
FEI Company, Achtseweg Noord 5, Eindhoven, The Netherlands.
Jens Greiser
Affiliation:
FEI Company, Achtseweg Noord 5, Eindhoven, The Netherlands.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 294 - 295
Copyright
© Microscopy Society of America 2017 

References

[1] Jungjohann, K. & Carter, C.B. Transmission Electron Microscopy: Diffraction Imaging & Spectrometry, Carter, C.B. & Williams, D.B (Eds.)Springer New Yorkp. 17.Google Scholar
[2] Zhong, X., et al, Microsc. Microanal 22 2016). p. 1350.Google Scholar
[3] Duchamp, M., et al, Microsc. Microanal 20 2014). p. 1638.Google Scholar
[4] This work was supported in part by a research grant from FEI Company under an FEI-UConn partnership agreement. The studies were performed in the UConn/FEI Center for Advanced Microscopy and Materials Analysis (CAMMA).Google Scholar