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Technologies to Characterize Nanostructured Particles and Bulk Materials

Published online by Cambridge University Press:  01 August 2005

H Jaksch
Affiliation:
Carl Zeiss NTS GmbH,Germany
M Steigerwald
Affiliation:
Carl Zeiss NTS GmbH,Germany
V Drexel
Affiliation:
Carl Zeiss NTS GmbH,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Copyright
© 2005 Microscopy Society of America